Improving NVM Lifetime Using Task Stack Migration on Low-End MCU-Based Devices
Tiny embedded devices are cost and energy-sensitive, and high-density emerging non-volatile memory (NVM) can help reduce energy consumption at a fraction of the cost. However, high-density NVM has low write endurance compared to volatile memory, so it is vulnerable to write concentration. Most NVM l...
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| Format: | Article |
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IEEE
2022-01-01
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| Series: | IEEE Access |
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| Online Access: | https://ieeexplore.ieee.org/document/9964379/ |
| _version_ | 1811208966180438016 |
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| author | Jeongmin Lee Moonseok Jang Kexin Wang Inyeong Song Hyeonggyu Jeong Jinwoo Jeong Yong Ho Song Jungwook Choi |
| author_facet | Jeongmin Lee Moonseok Jang Kexin Wang Inyeong Song Hyeonggyu Jeong Jinwoo Jeong Yong Ho Song Jungwook Choi |
| author_sort | Jeongmin Lee |
| collection | DOAJ |
| description | Tiny embedded devices are cost and energy-sensitive, and high-density emerging non-volatile memory (NVM) can help reduce energy consumption at a fraction of the cost. However, high-density NVM has low write endurance compared to volatile memory, so it is vulnerable to write concentration. Most NVM lifetime improvement studies in the existing embedded environment have distributed writes by modifying the mapping relationship between physical and logical addresses. However, applying the existing wear leveling techniques in low-end MCUs such as ARM Cortex M3/M4 that use only physical addresses is hard. Therefore, we wear-level the write-heavy stack area to improve the NVM lifetime in low-end MCUs. However, since the stack of bare metal applications is difficult to move during runtime, we implement the migration function targeting the task stack of FreeRTOS. The task stack moves based on time, and to avoid the pointer validation problem caused by the movement of the task stack, we migrate the stack under safe conditions. In addition, FreeRTOS uses a single heap to preferentially allocate to low free space, which reduces the degree of freedom where the stack moves, reducing the effect of distributing the writes. To alleviate this problem, we add another heap for the stack migration and introduce circular dynamic allocation in the heap. Through our experiments, the proposed method was about 19.6% larger than the ideal case of maximum write, and the computational overhead was about 0.2%. |
| first_indexed | 2024-04-12T04:32:02Z |
| format | Article |
| id | doaj.art-0faedb8b1cd843b098d05241e64e44b6 |
| institution | Directory Open Access Journal |
| issn | 2169-3536 |
| language | English |
| last_indexed | 2024-04-12T04:32:02Z |
| publishDate | 2022-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj.art-0faedb8b1cd843b098d05241e64e44b62022-12-22T03:47:55ZengIEEEIEEE Access2169-35362022-01-011012531912533310.1109/ACCESS.2022.32251939964379Improving NVM Lifetime Using Task Stack Migration on Low-End MCU-Based DevicesJeongmin Lee0https://orcid.org/0000-0002-1153-9736Moonseok Jang1https://orcid.org/0000-0003-3751-4630Kexin Wang2Inyeong Song3Hyeonggyu Jeong4Jinwoo Jeong5https://orcid.org/0000-0001-6485-0029Yong Ho Song6Jungwook Choi7https://orcid.org/0000-0002-5691-4771Department of Electronics Engineering, Hanyang University, Seoul, South KoreaDepartment of Electronics Engineering, Hanyang University, Seoul, South KoreaDepartment of Electronics Engineering, Hanyang University, Seoul, South KoreaDepartment of Electronics Engineering, Hanyang University, Seoul, South KoreaDepartment of Electronics Engineering, Hanyang University, Seoul, South KoreaDepartment of Electronics Engineering, Hanyang University, Seoul, South KoreaSamsung Electronics, Hwaseong, South KoreaDepartment of Electronics Engineering, Hanyang University, Seoul, South KoreaTiny embedded devices are cost and energy-sensitive, and high-density emerging non-volatile memory (NVM) can help reduce energy consumption at a fraction of the cost. However, high-density NVM has low write endurance compared to volatile memory, so it is vulnerable to write concentration. Most NVM lifetime improvement studies in the existing embedded environment have distributed writes by modifying the mapping relationship between physical and logical addresses. However, applying the existing wear leveling techniques in low-end MCUs such as ARM Cortex M3/M4 that use only physical addresses is hard. Therefore, we wear-level the write-heavy stack area to improve the NVM lifetime in low-end MCUs. However, since the stack of bare metal applications is difficult to move during runtime, we implement the migration function targeting the task stack of FreeRTOS. The task stack moves based on time, and to avoid the pointer validation problem caused by the movement of the task stack, we migrate the stack under safe conditions. In addition, FreeRTOS uses a single heap to preferentially allocate to low free space, which reduces the degree of freedom where the stack moves, reducing the effect of distributing the writes. To alleviate this problem, we add another heap for the stack migration and introduce circular dynamic allocation in the heap. Through our experiments, the proposed method was about 19.6% larger than the ideal case of maximum write, and the computational overhead was about 0.2%.https://ieeexplore.ieee.org/document/9964379/Embedded softwarememory managementnonvolatile memoryreal-time systems |
| spellingShingle | Jeongmin Lee Moonseok Jang Kexin Wang Inyeong Song Hyeonggyu Jeong Jinwoo Jeong Yong Ho Song Jungwook Choi Improving NVM Lifetime Using Task Stack Migration on Low-End MCU-Based Devices IEEE Access Embedded software memory management nonvolatile memory real-time systems |
| title | Improving NVM Lifetime Using Task Stack Migration on Low-End MCU-Based Devices |
| title_full | Improving NVM Lifetime Using Task Stack Migration on Low-End MCU-Based Devices |
| title_fullStr | Improving NVM Lifetime Using Task Stack Migration on Low-End MCU-Based Devices |
| title_full_unstemmed | Improving NVM Lifetime Using Task Stack Migration on Low-End MCU-Based Devices |
| title_short | Improving NVM Lifetime Using Task Stack Migration on Low-End MCU-Based Devices |
| title_sort | improving nvm lifetime using task stack migration on low end mcu based devices |
| topic | Embedded software memory management nonvolatile memory real-time systems |
| url | https://ieeexplore.ieee.org/document/9964379/ |
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