Improving NVM Lifetime Using Task Stack Migration on Low-End MCU-Based Devices

Tiny embedded devices are cost and energy-sensitive, and high-density emerging non-volatile memory (NVM) can help reduce energy consumption at a fraction of the cost. However, high-density NVM has low write endurance compared to volatile memory, so it is vulnerable to write concentration. Most NVM l...

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Bibliographic Details
Main Authors: Jeongmin Lee, Moonseok Jang, Kexin Wang, Inyeong Song, Hyeonggyu Jeong, Jinwoo Jeong, Yong Ho Song, Jungwook Choi
Format: Article
Language:English
Published: IEEE 2022-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9964379/