Improving NVM Lifetime Using Task Stack Migration on Low-End MCU-Based Devices
Tiny embedded devices are cost and energy-sensitive, and high-density emerging non-volatile memory (NVM) can help reduce energy consumption at a fraction of the cost. However, high-density NVM has low write endurance compared to volatile memory, so it is vulnerable to write concentration. Most NVM l...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2022-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9964379/ |