Semiconductors (LEDs) quality control based in high-resolution 3D X-ray microscope

Semiconductors (LEDs) quality control based in high-resolution 3D X-ray microscope

Electronic devices are getting smaller each time and the technology, increasingly complex. Commonly found problems such as reflow soldering and open solder connections, which are mostly difficult to detect by conventional means like X-ray images or physical cut on the transverse section. Along with...

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Bibliographic Details
Main Authors: Diogo da Costa, Marcelino dos Anjos, Davi Oliveira, Alessandra Machado, Joaquim Assis, Ricardo Lopes
Format: Article
Language:English
Published: Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR) 2022-12-01
Series:Brazilian Journal of Radiation Sciences
Subjects:
Computed microtomography
Semiconductor integrity
LED microtomography.
Online Access:https://bjrs.org.br/revista/index.php/REVISTA/article/view/1955

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