Definition and evaluation of forecast quality models for the integrated circuits with the use of theory of pattern recognition
The paper is devoted to the technique of the forecast models for the integrated circuits of 564 series based on the methods of the theory of pattern recognition. Methods of regression models and discriminant functions were used for the model-building. Analysis of the obtained models was carried out....
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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Povolzhskiy State University of Telecommunications & Informatics
2020-02-01
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| Series: | Физика волновых процессов и радиотехнические системы |
| Subjects: | |
| Online Access: | https://journals.ssau.ru/pwp/article/viewFile/7953/7804 |
| _version_ | 1797382553529745408 |
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| author | Katerina S. Erantseva Mikhail N. Piganov Roman O. Mishanov Alina A. Denisyuk |
| author_facet | Katerina S. Erantseva Mikhail N. Piganov Roman O. Mishanov Alina A. Denisyuk |
| author_sort | Katerina S. Erantseva |
| collection | DOAJ |
| description | The paper is devoted to the technique of the forecast models for the integrated circuits of 564 series based on the methods of the theory of pattern recognition. Methods of regression models and discriminant functions were used for the model-building. Analysis of the obtained models was carried out. The optimal threshold values of the discriminant and regression functions were determined. The values of the risk of incorrect decision, producers risk (-risk) and consumers risk (-risk) were estimated. |
| first_indexed | 2024-03-08T21:08:09Z |
| format | Article |
| id | doaj.art-10614fcd75cd4fa9883e2580eb168e96 |
| institution | Directory Open Access Journal |
| issn | 1810-3189 2782-294X |
| language | English |
| last_indexed | 2024-03-08T21:08:09Z |
| publishDate | 2020-02-01 |
| publisher | Povolzhskiy State University of Telecommunications & Informatics |
| record_format | Article |
| series | Физика волновых процессов и радиотехнические системы |
| spelling | doaj.art-10614fcd75cd4fa9883e2580eb168e962023-12-22T10:31:40ZengPovolzhskiy State University of Telecommunications & InformaticsФизика волновых процессов и радиотехнические системы1810-31892782-294X2020-02-01232768010.18469/1810-3189.2020.23.2.76-807411Definition and evaluation of forecast quality models for the integrated circuits with the use of theory of pattern recognitionKaterina S. Erantseva0Mikhail N. Piganov1Roman O. Mishanov2Alina A. Denisyuk3Samara National Research UniversitySamara National Research UniversitySamara National Research UniversitySamara National Research UniversityThe paper is devoted to the technique of the forecast models for the integrated circuits of 564 series based on the methods of the theory of pattern recognition. Methods of regression models and discriminant functions were used for the model-building. Analysis of the obtained models was carried out. The optimal threshold values of the discriminant and regression functions were determined. The values of the risk of incorrect decision, producers risk (-risk) and consumers risk (-risk) were estimated.https://journals.ssau.ru/pwp/article/viewFile/7953/7804individual forecastingintegrated circuitsampleforecast modelmethod of regression modelsmethod of discriminant functionsprobabilistic characteristics |
| spellingShingle | Katerina S. Erantseva Mikhail N. Piganov Roman O. Mishanov Alina A. Denisyuk Definition and evaluation of forecast quality models for the integrated circuits with the use of theory of pattern recognition Физика волновых процессов и радиотехнические системы individual forecasting integrated circuit sample forecast model method of regression models method of discriminant functions probabilistic characteristics |
| title | Definition and evaluation of forecast quality models for the integrated circuits with the use of theory of pattern recognition |
| title_full | Definition and evaluation of forecast quality models for the integrated circuits with the use of theory of pattern recognition |
| title_fullStr | Definition and evaluation of forecast quality models for the integrated circuits with the use of theory of pattern recognition |
| title_full_unstemmed | Definition and evaluation of forecast quality models for the integrated circuits with the use of theory of pattern recognition |
| title_short | Definition and evaluation of forecast quality models for the integrated circuits with the use of theory of pattern recognition |
| title_sort | definition and evaluation of forecast quality models for the integrated circuits with the use of theory of pattern recognition |
| topic | individual forecasting integrated circuit sample forecast model method of regression models method of discriminant functions probabilistic characteristics |
| url | https://journals.ssau.ru/pwp/article/viewFile/7953/7804 |
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