Automation of quantum dot measurement analysis via explainable machine learning

Automation of quantum dot measurement analysis via explainable machine learning

The rapid development of quantum dot (QD) devices for quantum computing has necessitated more efficient and automated methods for device characterization and tuning. Many of the measurements acquired during the tuning process come in the form of images that need to be properly analyzed to guide the...

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Bibliografiske detaljer
Main Authors: Daniel Schug, Tyler J Kovach, M A Wolfe, Jared Benson, Sanghyeok Park, J P Dodson, J Corrigan, M A Eriksson, Justyna P Zwolak
Format: Article
Sprog:English
Udgivet: IOP Publishing 2025-01-01
Serier:Machine Learning: Science and Technology
Fag:
explainable machine learning
explainable boosting machines
semiconductor quantum dots
Online adgang:https://doi.org/10.1088/2632-2153/ada087

Internet

https://doi.org/10.1088/2632-2153/ada087

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