Distance Measurement of a Frequency-Shifted Sub-Terahertz Wave Source
In this paper, we report the development of a frequency-shifted (FS) terahertz (THz) wave source for the non-destructive inspection of buildings. Currently, terahertz-time domain spectroscopy (THz-TDS) is the mainstream method for non-destructive inspection using THz waves. However, THz-TDS is limit...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-02-01
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| Series: | Photonics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2304-6732/9/3/128 |
| Summary: | In this paper, we report the development of a frequency-shifted (FS) terahertz (THz) wave source for the non-destructive inspection of buildings. Currently, terahertz-time domain spectroscopy (THz-TDS) is the mainstream method for non-destructive inspection using THz waves. However, THz-TDS is limited by its measurement range and difficulties encountered when there is a strong frequency dependence in the absorption characteristics and refractive index of the measurement target. To address these issues, we developed a novel non-destructive approach for inspection applications using frequency-shifted THz waves. Our system uses a frequency-shifted feedback (FSF) laser as the pump light source to generate FS-THz waves; this allowed us to obtain precise distance measurements of objects over a broad range of distances. We tested a prototype FS-THz system and confirmed successful measurement of spatial distances inside a building material. |
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| ISSN: | 2304-6732 |