Femtosecond Laser Ablation-Induced Magnetic Phase Transformations in FeRh Thin Films

In this study, we present a novel investigation into the magnetic and morphological properties of equiatomic B2-ordered FeRh thin films irradiated with single high-intensity ultrashort laser pulses. The goal is to elucidate the effect of femtosecond laser ablation on the magnetic properties of FeRh....

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Bibliographic Details
Main Authors: Pavel Varlamov, Anna Semisalova, Anh Dung Nguyen, Michael Farle, Yannis Laplace, Michele Raynaud, Olivier Noel, Paolo Vavassori, Vasily Temnov
Format: Article
Language:English
Published: MDPI AG 2023-07-01
Series:Magnetochemistry
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Online Access:https://www.mdpi.com/2312-7481/9/7/186
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Summary:In this study, we present a novel investigation into the magnetic and morphological properties of equiatomic B2-ordered FeRh thin films irradiated with single high-intensity ultrashort laser pulses. The goal is to elucidate the effect of femtosecond laser ablation on the magnetic properties of FeRh. We employed Scanning Magneto-Optical Kerr Effect (S-MOKE) microscopy to examine the magnetic phase after laser processing, providing high spatial resolution and sensitivity. Our results for the first time demonstrated the appearance of a magneto-optical signal from the bottom of ablation craters, suggesting a transition from antiferromagnetic to ferromagnetic behavior. Fluence-resolved measurements clearly demonstrate that the ablation threshold coincides with the threshold of the antiferromagnet-to-ferromagnet phase transition. The existence of such a magnetic phase transition was independently confirmed by temperature-dependent S-MOKE measurements using a CW laser as a localized heat source. Whereas the initial FeRh film displayed a reversible antiferromagnet-ferromagnet phase transition, the laser-ablated structures exhibited irreversible changes in their magnetic properties. This comprehensive analysis revealed the strong correlation between the femtosecond laser ablation process and the magnetic phase transformation in FeRh thin films.
ISSN:2312-7481