Two-Mode Waveguide Characterization by Intensity Measurements from Exit Face Images
A method that characterizes two-mode waveguides whose modes cannot be selectively excited (such as buried waveguides) is presented and demonstrated. The theoretical results are presented for <formula formulatype="inline"> <tex Notation="TeX">$N$</tex></formul...
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2012-01-01
|
| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/6095574/ |
| _version_ | 1819102781899800576 |
|---|---|
| author | Xesús Prieto-Blanco Jesús Linares |
| author_facet | Xesús Prieto-Blanco Jesús Linares |
| author_sort | Xesús Prieto-Blanco |
| collection | DOAJ |
| description | A method that characterizes two-mode waveguides whose modes cannot be selectively excited (such as buried waveguides) is presented and demonstrated. The theoretical results are presented for <formula formulatype="inline"> <tex Notation="TeX">$N$</tex></formula> modes, although for the sake of simplicity, only the two-mode case is developed. The values of the optical mode fields are recovered from several images of the waveguide exit face, where both modes interfere with different relative intensity in each image. From these mode fields, both the squared index distribution, except in an additive constant, and the effective index difference can be obtained by inverting the Helmholtz equation. As in the case of the standard monomode intensity method, the relative values of effective indices and index distributions become absolute if the modes are retrieved in a point of known index, for instance, in the substrate. The method can also be applied to multimode guides if only two modes are excited. In fact, an inexpensive setup is proposed to excite the first two modes of a multimode buried waveguide. This waveguide was fabricated by ion exchange in glass and buried by electromigration. The shape of the squared refractive index recovered by the proposed method agrees with that reported in the literature. |
| first_indexed | 2024-12-22T01:40:01Z |
| format | Article |
| id | doaj.art-120c769bba164179b1d23d0cf6898731 |
| institution | Directory Open Access Journal |
| issn | 1943-0655 |
| language | English |
| last_indexed | 2024-12-22T01:40:01Z |
| publishDate | 2012-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Photonics Journal |
| spelling | doaj.art-120c769bba164179b1d23d0cf68987312022-12-21T18:43:16ZengIEEEIEEE Photonics Journal1943-06552012-01-0141657910.1109/JPHOT.2011.21775166095574Two-Mode Waveguide Characterization by Intensity Measurements from Exit Face ImagesXesús Prieto-Blanco0Jesús Linares1Departamento de Física Aplicada, Área de Óptica, Escola Universitaria de Óptica e Optometría, Campus Vida, Universidade de Santiago de Compostela, Galicia, SpainDepartamento de Física Aplicada, Área de Óptica, Escola Universitaria de Óptica e Optometría, Campus Vida, Universidade de Santiago de Compostela, Galicia, SpainA method that characterizes two-mode waveguides whose modes cannot be selectively excited (such as buried waveguides) is presented and demonstrated. The theoretical results are presented for <formula formulatype="inline"> <tex Notation="TeX">$N$</tex></formula> modes, although for the sake of simplicity, only the two-mode case is developed. The values of the optical mode fields are recovered from several images of the waveguide exit face, where both modes interfere with different relative intensity in each image. From these mode fields, both the squared index distribution, except in an additive constant, and the effective index difference can be obtained by inverting the Helmholtz equation. As in the case of the standard monomode intensity method, the relative values of effective indices and index distributions become absolute if the modes are retrieved in a point of known index, for instance, in the substrate. The method can also be applied to multimode guides if only two modes are excited. In fact, an inexpensive setup is proposed to excite the first two modes of a multimode buried waveguide. This waveguide was fabricated by ion exchange in glass and buried by electromigration. The shape of the squared refractive index recovered by the proposed method agrees with that reported in the literature.https://ieeexplore.ieee.org/document/6095574/Visible laserswaveguide deviceswaveguide characterization |
| spellingShingle | Xesús Prieto-Blanco Jesús Linares Two-Mode Waveguide Characterization by Intensity Measurements from Exit Face Images IEEE Photonics Journal Visible lasers waveguide devices waveguide characterization |
| title | Two-Mode Waveguide Characterization by Intensity Measurements from Exit Face Images |
| title_full | Two-Mode Waveguide Characterization by Intensity Measurements from Exit Face Images |
| title_fullStr | Two-Mode Waveguide Characterization by Intensity Measurements from Exit Face Images |
| title_full_unstemmed | Two-Mode Waveguide Characterization by Intensity Measurements from Exit Face Images |
| title_short | Two-Mode Waveguide Characterization by Intensity Measurements from Exit Face Images |
| title_sort | two mode waveguide characterization by intensity measurements from exit face images |
| topic | Visible lasers waveguide devices waveguide characterization |
| url | https://ieeexplore.ieee.org/document/6095574/ |
| work_keys_str_mv | AT xesx00fasprietoblanco twomodewaveguidecharacterizationbyintensitymeasurementsfromexitfaceimages AT jesx00faslinares twomodewaveguidecharacterizationbyintensitymeasurementsfromexitfaceimages |