Deep learning for exploring ultra-thin ferroelectrics with highly improved sensitivity of piezoresponse force microscopy

Abstract Hafnium oxide-based ferroelectrics have been extensively studied because of their existing ferroelectricity, even in ultra-thin film form. However, studying the weak response from ultra-thin film requires improved measurement sensitivity. In general, resonance-enhanced piezoresponse force m...

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Main Authors: Panithan Sriboriboon, Huimin Qiao, Owoong Kwon, Rama K. Vasudevan, Stephen Jesse, Yunseok Kim
Format: Article
Language:English
Published: Nature Portfolio 2023-02-01
Series:npj Computational Materials
Online Access:https://doi.org/10.1038/s41524-023-00982-0
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author Panithan Sriboriboon
Huimin Qiao
Owoong Kwon
Rama K. Vasudevan
Stephen Jesse
Yunseok Kim
author_facet Panithan Sriboriboon
Huimin Qiao
Owoong Kwon
Rama K. Vasudevan
Stephen Jesse
Yunseok Kim
author_sort Panithan Sriboriboon
collection DOAJ
description Abstract Hafnium oxide-based ferroelectrics have been extensively studied because of their existing ferroelectricity, even in ultra-thin film form. However, studying the weak response from ultra-thin film requires improved measurement sensitivity. In general, resonance-enhanced piezoresponse force microscopy (PFM) has been used to characterize ferroelectricity by fitting a simple harmonic oscillation model with the resonance spectrum. However, an iterative approach, such as traditional least squares (LS) fitting, is sensitive to noise and can result in the misunderstanding of weak responses. In this study, we developed the deep neural network (DNN) hybrid with deep denoising autoencoder (DDA) and principal component analysis (PCA) to extract resonance information. The DDA/PCA-DNN improves the PFM sensitivity down to 0.3 pm, allowing measurement of weak piezoresponse with low excitation voltage in 10-nm-thick Hf0.5Zr0.5O2 thin films. Our hybrid approaches could provide more chances to explore the low piezoresponse of the ultra-thin ferroelectrics and could be applied to other microscopic techniques.
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spelling doaj.art-12264c3e13d143369d9d4bf4c8b5ec872023-03-22T11:50:23ZengNature Portfolionpj Computational Materials2057-39602023-02-01911810.1038/s41524-023-00982-0Deep learning for exploring ultra-thin ferroelectrics with highly improved sensitivity of piezoresponse force microscopyPanithan Sriboriboon0Huimin Qiao1Owoong Kwon2Rama K. Vasudevan3Stephen Jesse4Yunseok Kim5School of Advanced Materials and Engineering, Sungkyunkwan University (SKKU)School of Advanced Materials and Engineering, Sungkyunkwan University (SKKU)School of Advanced Materials and Engineering, Sungkyunkwan University (SKKU)Center for Nanophase Materials Sciences, Oak Ridge National LaboratoryCenter for Nanophase Materials Sciences, Oak Ridge National LaboratorySchool of Advanced Materials and Engineering, Sungkyunkwan University (SKKU)Abstract Hafnium oxide-based ferroelectrics have been extensively studied because of their existing ferroelectricity, even in ultra-thin film form. However, studying the weak response from ultra-thin film requires improved measurement sensitivity. In general, resonance-enhanced piezoresponse force microscopy (PFM) has been used to characterize ferroelectricity by fitting a simple harmonic oscillation model with the resonance spectrum. However, an iterative approach, such as traditional least squares (LS) fitting, is sensitive to noise and can result in the misunderstanding of weak responses. In this study, we developed the deep neural network (DNN) hybrid with deep denoising autoencoder (DDA) and principal component analysis (PCA) to extract resonance information. The DDA/PCA-DNN improves the PFM sensitivity down to 0.3 pm, allowing measurement of weak piezoresponse with low excitation voltage in 10-nm-thick Hf0.5Zr0.5O2 thin films. Our hybrid approaches could provide more chances to explore the low piezoresponse of the ultra-thin ferroelectrics and could be applied to other microscopic techniques.https://doi.org/10.1038/s41524-023-00982-0
spellingShingle Panithan Sriboriboon
Huimin Qiao
Owoong Kwon
Rama K. Vasudevan
Stephen Jesse
Yunseok Kim
Deep learning for exploring ultra-thin ferroelectrics with highly improved sensitivity of piezoresponse force microscopy
npj Computational Materials
title Deep learning for exploring ultra-thin ferroelectrics with highly improved sensitivity of piezoresponse force microscopy
title_full Deep learning for exploring ultra-thin ferroelectrics with highly improved sensitivity of piezoresponse force microscopy
title_fullStr Deep learning for exploring ultra-thin ferroelectrics with highly improved sensitivity of piezoresponse force microscopy
title_full_unstemmed Deep learning for exploring ultra-thin ferroelectrics with highly improved sensitivity of piezoresponse force microscopy
title_short Deep learning for exploring ultra-thin ferroelectrics with highly improved sensitivity of piezoresponse force microscopy
title_sort deep learning for exploring ultra thin ferroelectrics with highly improved sensitivity of piezoresponse force microscopy
url https://doi.org/10.1038/s41524-023-00982-0
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