Modelling fine-sliced three dimensional electron diffraction data with dynamical Bloch-wave simulations
Recent interest in structure solution and refinement using electron diffraction (ED) has been fuelled by its inherent advantages when applied to crystals of sub-micrometre size, as well as its better sensitivity to light elements. Currently, data are often processed with software written for X-ray d...
Main Authors: | Anton Cleverley, Richard Beanland |
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Format: | Article |
Language: | English |
Published: |
International Union of Crystallography
2023-01-01
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Series: | IUCrJ |
Subjects: | |
Online Access: | http://scripts.iucr.org/cgi-bin/paper?S2052252522011290 |
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