Modelling fine-sliced three dimensional electron diffraction data with dynamical Bloch-wave simulations

Recent interest in structure solution and refinement using electron diffraction (ED) has been fuelled by its inherent advantages when applied to crystals of sub-micrometre size, as well as its better sensitivity to light elements. Currently, data are often processed with software written for X-ray d...

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Bibliographic Details
Main Authors: Anton Cleverley, Richard Beanland
Format: Article
Language:English
Published: International Union of Crystallography 2023-01-01
Series:IUCrJ
Subjects:
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252522011290

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