Uncovering the Different Components of Contact Resistance to Atomically Thin Semiconductors
Abstract Achieving good electrical contacts is one of the major challenges in realizing devices based on atomically thin 2D semiconductors. Several studies have examined this hurdle, but a universal understanding of the contact resistance (Rc) and an underlying approach to its reduction are currentl...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley-VCH
2023-06-01
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| Series: | Advanced Electronic Materials |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/aelm.202201342 |