Image Retrieval System Using Kirsch based Local Ternary Pattern
This paper addresses the challenge imposed by the tremendous growth of digital data to retrieve relevant images. In this paper, a novel feature design methodology is proposed to represent images efficiently for Content Based Image Retrieval (CBIR). Generally, local patterns are computed directly on...
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Format: | Article |
Language: | English |
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VSB-Technical University of Ostrava
2023-01-01
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Series: | Advances in Electrical and Electronic Engineering |
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Online Access: | http://advances.utc.sk/index.php/AEEE/article/view/4706 |
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author | Megha Agarwal |
author_facet | Megha Agarwal |
author_sort | Megha Agarwal |
collection | DOAJ |
description | This paper addresses the challenge imposed by the tremendous growth of digital data to retrieve relevant images. In this paper, a novel feature design methodology is proposed to represent images efficiently for Content Based Image Retrieval (CBIR). Generally, local patterns are computed directly on images and hence, directional information of the images is ignored. In the proposed feature, Kirsch operators are used to highlight eight major directional changes in the image and further, Kirsch Ternary Local Pattern (KLTP) is extracted by analysing local intensity variations in the neighbourhood. In KLTP, global color information is also incorporated to make it robust and perform well on variety of images. Experiments on natural and texture databases are done to verify the performance, as compared to the available features in the literature. |
first_indexed | 2024-04-09T12:39:22Z |
format | Article |
id | doaj.art-12e4e95b9bec4611a716b9e3eb714a05 |
institution | Directory Open Access Journal |
issn | 1336-1376 1804-3119 |
language | English |
last_indexed | 2024-04-09T12:39:22Z |
publishDate | 2023-01-01 |
publisher | VSB-Technical University of Ostrava |
record_format | Article |
series | Advances in Electrical and Electronic Engineering |
spelling | doaj.art-12e4e95b9bec4611a716b9e3eb714a052023-05-14T20:50:14ZengVSB-Technical University of OstravaAdvances in Electrical and Electronic Engineering1336-13761804-31192023-01-01211283610.15598/aeee.v21i1.47061192Image Retrieval System Using Kirsch based Local Ternary PatternMegha Agarwal0Department of Electronics and Communication Engineering, Jaypee Institute of Information Technology, A-10, Sector-62, 201309 Noida, Uttar Pradesh, IndiaThis paper addresses the challenge imposed by the tremendous growth of digital data to retrieve relevant images. In this paper, a novel feature design methodology is proposed to represent images efficiently for Content Based Image Retrieval (CBIR). Generally, local patterns are computed directly on images and hence, directional information of the images is ignored. In the proposed feature, Kirsch operators are used to highlight eight major directional changes in the image and further, Kirsch Ternary Local Pattern (KLTP) is extracted by analysing local intensity variations in the neighbourhood. In KLTP, global color information is also incorporated to make it robust and perform well on variety of images. Experiments on natural and texture databases are done to verify the performance, as compared to the available features in the literature.http://advances.utc.sk/index.php/AEEE/article/view/4706corel 1kimage retrievalpatterntexture database. |
spellingShingle | Megha Agarwal Image Retrieval System Using Kirsch based Local Ternary Pattern Advances in Electrical and Electronic Engineering corel 1k image retrieval pattern texture database. |
title | Image Retrieval System Using Kirsch based Local Ternary Pattern |
title_full | Image Retrieval System Using Kirsch based Local Ternary Pattern |
title_fullStr | Image Retrieval System Using Kirsch based Local Ternary Pattern |
title_full_unstemmed | Image Retrieval System Using Kirsch based Local Ternary Pattern |
title_short | Image Retrieval System Using Kirsch based Local Ternary Pattern |
title_sort | image retrieval system using kirsch based local ternary pattern |
topic | corel 1k image retrieval pattern texture database. |
url | http://advances.utc.sk/index.php/AEEE/article/view/4706 |
work_keys_str_mv | AT meghaagarwal imageretrievalsystemusingkirschbasedlocalternarypattern |