A Specular Highlight Removal Algorithm for Quality Inspection of Fresh Fruits

Nondestructive inspection technology based on machine vision can effectively improve the efficiency of fresh fruit quality inspection. However, fruits with smooth skin and less texture are easily affected by specular highlights during the image acquisition, resulting in light spots appearing on the...

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Bibliographic Details
Main Authors: Jinglei Hao, Yongqiang Zhao, Qunnie Peng
Format: Article
Language:English
Published: MDPI AG 2022-07-01
Series:Remote Sensing
Subjects:
Online Access:https://www.mdpi.com/2072-4292/14/13/3215
Description
Summary:Nondestructive inspection technology based on machine vision can effectively improve the efficiency of fresh fruit quality inspection. However, fruits with smooth skin and less texture are easily affected by specular highlights during the image acquisition, resulting in light spots appearing on the surface of fruits, which severely affects the subsequent quality inspection. Aiming at this issue, we propose a new specular highlight removal algorithm based on multi-band polarization imaging. First of all, we realize real-time image acquisition by designing a new multi-band polarization imager, which can acquire all the spectral and polarization information through single image capture. Then we propose a joint multi-band-polarization characteristic vector constraint to realize the detection of specular highlight, and next we put forward a Max-Min multi-band-polarization differencing scheme combined with an ergodic least-squares separation for specular highlight removal, and finally, the chromaticity consistency regularization is used to compensate the missing details. Experimental results demonstrate that the proposed algorithm can effectively and stably remove the specular highlight and provide more accurate information for subsequent fruit quality inspection. Besides, the comparison of algorithm speed further shows that our proposed algorithm has a good tradeoff between accuracy and complexity.
ISSN:2072-4292