Electron backscatter diffraction in materials characterization
Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete...
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| Format: | Article |
| Language: | English |
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University of Novi Sad
2012-03-01
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| Series: | Processing and Application of Ceramics |
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| Online Access: | http://tf.uns.ac.rs/publikacije/PAC/pdf/PAC%2015%2001.pdf |
| _version_ | 1830484965629886464 |
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| author | Dejan Stojakovic |
| author_facet | Dejan Stojakovic |
| author_sort | Dejan Stojakovic |
| collection | DOAJ |
| description | Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of materials. Key milestones related to technological developments of EBSD technique have been outlined along with possible applications using modern EBSD system. Principles of crystal diffraction with description of crystallographic orientation, orientation determination and phase identification have been described. Image quality, resolution and speed, and system calibration have also been discussed. Sample preparation methods were reviewed and EBSD application in conjunction with other characterization techniques on a variety of materials has been presented for several case studies. In summary, an outlook for EBSD technique was provided. |
| first_indexed | 2024-12-21T18:17:05Z |
| format | Article |
| id | doaj.art-13e2659e532d4d4693784c71afea1314 |
| institution | Directory Open Access Journal |
| issn | 1820-6131 |
| language | English |
| last_indexed | 2024-12-21T18:17:05Z |
| publishDate | 2012-03-01 |
| publisher | University of Novi Sad |
| record_format | Article |
| series | Processing and Application of Ceramics |
| spelling | doaj.art-13e2659e532d4d4693784c71afea13142022-12-21T18:54:38ZengUniversity of Novi SadProcessing and Application of Ceramics1820-61312012-03-0161113Electron backscatter diffraction in materials characterizationDejan StojakovicElectron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of materials. Key milestones related to technological developments of EBSD technique have been outlined along with possible applications using modern EBSD system. Principles of crystal diffraction with description of crystallographic orientation, orientation determination and phase identification have been described. Image quality, resolution and speed, and system calibration have also been discussed. Sample preparation methods were reviewed and EBSD application in conjunction with other characterization techniques on a variety of materials has been presented for several case studies. In summary, an outlook for EBSD technique was provided.http://tf.uns.ac.rs/publikacije/PAC/pdf/PAC%2015%2001.pdfEBSDCharacterizationMicrostructureProperties |
| spellingShingle | Dejan Stojakovic Electron backscatter diffraction in materials characterization Processing and Application of Ceramics EBSD Characterization Microstructure Properties |
| title | Electron backscatter diffraction in materials characterization |
| title_full | Electron backscatter diffraction in materials characterization |
| title_fullStr | Electron backscatter diffraction in materials characterization |
| title_full_unstemmed | Electron backscatter diffraction in materials characterization |
| title_short | Electron backscatter diffraction in materials characterization |
| title_sort | electron backscatter diffraction in materials characterization |
| topic | EBSD Characterization Microstructure Properties |
| url | http://tf.uns.ac.rs/publikacije/PAC/pdf/PAC%2015%2001.pdf |
| work_keys_str_mv | AT dejanstojakovic electronbackscatterdiffractioninmaterialscharacterization |