Determination of layer morphology of rough layers in organic light emitting diodes by X‐ray reflectivity

Determination of layer morphology of rough layers in organic light emitting diodes by X‐ray reflectivity

Abstract X‐ray reflectivity (XRR) has been proven to be a useful tool to investigate thin layers as well as buried interfaces in stacks built of very thin layers. Nevertheless, x‐ray reflectivity measurements are limited by the roughness of the layers and interfaces as the roughness destroys the int...

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Bibliographic Details
Main Authors: Ian Sachs, Marc Fuhrmann, Wim Deferme, Hildegard Möbius
Format: Article
Language:English
Published: Wiley 2023-04-01
Series:Engineering Reports
Subjects:
AFM
contrast enhancement
ITO spikes
OLED
x‐ray reflection
Online Access:https://doi.org/10.1002/eng2.12594

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