Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling

Evolution of depth profiles of the refractive index in Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub> (YAG) crystals were studied under 200 MeV <sup>136</sup>Xe<sup>14+</sup> ion irradiation, since the index can be related with the stress change...

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Main Authors: Hiroshi Amekura, Rang Li, Nariaki Okubo, Norito Ishikawa, Feng Chen
Format: Article
Language:English
Published: MDPI AG 2020-11-01
Series:Quantum Beam Science
Subjects:
Online Access:https://www.mdpi.com/2412-382X/4/4/39
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author Hiroshi Amekura
Rang Li
Nariaki Okubo
Norito Ishikawa
Feng Chen
author_facet Hiroshi Amekura
Rang Li
Nariaki Okubo
Norito Ishikawa
Feng Chen
author_sort Hiroshi Amekura
collection DOAJ
description Evolution of depth profiles of the refractive index in Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub> (YAG) crystals were studied under 200 MeV <sup>136</sup>Xe<sup>14+</sup> ion irradiation, since the index can be related with the stress change and/or the defect formation by the irradiation. Using the prism-coupling and the end-surface coupling methods, various waveguide (WG) modes were detected. Then, the index depth profiles were determined by reproducing the observed WG modes. The index changes were observed at three different depth regions; (i) a sharp dip at 13 μm in depth, which is attributed to the nuclear stopping <i>S</i><sub>n</sub> peak, (ii) a plateau near the surface between 0 and 3 μm in depth, which can be ascribed to the electronic stopping <i>S</i><sub>e</sub>, since <i>S</i><sub>e</sub> has a very broad peak at the surface, and (iii) a broad peak at 6 μm in depth. Since the last peak is ascribed to neither of <i>S</i><sub>e</sub> nor <i>S</i><sub>n</sub> peak, it could be attributed to the synergy effect of <i>S</i><sub>e</sub> and <i>S</i><sub>n.</sub>
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spelling doaj.art-150b85c4a1e54ba9b47dff091d7152482023-11-20T21:04:32ZengMDPI AGQuantum Beam Science2412-382X2020-11-01443910.3390/qubs4040039Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth ProfilingHiroshi Amekura0Rang Li1Nariaki Okubo2Norito Ishikawa3Feng Chen4National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0003, JapanSchool of Physics, State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, ChinaJapan Atomic Energy Agency (JAEA), Tokai, Ibaraki 319-1195, JapanJapan Atomic Energy Agency (JAEA), Tokai, Ibaraki 319-1195, JapanSchool of Physics, State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, ChinaEvolution of depth profiles of the refractive index in Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub> (YAG) crystals were studied under 200 MeV <sup>136</sup>Xe<sup>14+</sup> ion irradiation, since the index can be related with the stress change and/or the defect formation by the irradiation. Using the prism-coupling and the end-surface coupling methods, various waveguide (WG) modes were detected. Then, the index depth profiles were determined by reproducing the observed WG modes. The index changes were observed at three different depth regions; (i) a sharp dip at 13 μm in depth, which is attributed to the nuclear stopping <i>S</i><sub>n</sub> peak, (ii) a plateau near the surface between 0 and 3 μm in depth, which can be ascribed to the electronic stopping <i>S</i><sub>e</sub>, since <i>S</i><sub>e</sub> has a very broad peak at the surface, and (iii) a broad peak at 6 μm in depth. Since the last peak is ascribed to neither of <i>S</i><sub>e</sub> nor <i>S</i><sub>n</sub> peak, it could be attributed to the synergy effect of <i>S</i><sub>e</sub> and <i>S</i><sub>n.</sub>https://www.mdpi.com/2412-382X/4/4/39swift heavy ionYAG (Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub>)refractive index profilingsynergy effectoptical waveguide
spellingShingle Hiroshi Amekura
Rang Li
Nariaki Okubo
Norito Ishikawa
Feng Chen
Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling
Quantum Beam Science
swift heavy ion
YAG (Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub>)
refractive index profiling
synergy effect
optical waveguide
title Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling
title_full Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling
title_fullStr Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling
title_full_unstemmed Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling
title_short Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling
title_sort irradiation effects of swift heavy ions detected by refractive index depth profiling
topic swift heavy ion
YAG (Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub>)
refractive index profiling
synergy effect
optical waveguide
url https://www.mdpi.com/2412-382X/4/4/39
work_keys_str_mv AT hiroshiamekura irradiationeffectsofswiftheavyionsdetectedbyrefractiveindexdepthprofiling
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AT nariakiokubo irradiationeffectsofswiftheavyionsdetectedbyrefractiveindexdepthprofiling
AT noritoishikawa irradiationeffectsofswiftheavyionsdetectedbyrefractiveindexdepthprofiling
AT fengchen irradiationeffectsofswiftheavyionsdetectedbyrefractiveindexdepthprofiling