Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling
Evolution of depth profiles of the refractive index in Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub> (YAG) crystals were studied under 200 MeV <sup>136</sup>Xe<sup>14+</sup> ion irradiation, since the index can be related with the stress change...
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MDPI AG
2020-11-01
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author | Hiroshi Amekura Rang Li Nariaki Okubo Norito Ishikawa Feng Chen |
author_facet | Hiroshi Amekura Rang Li Nariaki Okubo Norito Ishikawa Feng Chen |
author_sort | Hiroshi Amekura |
collection | DOAJ |
description | Evolution of depth profiles of the refractive index in Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub> (YAG) crystals were studied under 200 MeV <sup>136</sup>Xe<sup>14+</sup> ion irradiation, since the index can be related with the stress change and/or the defect formation by the irradiation. Using the prism-coupling and the end-surface coupling methods, various waveguide (WG) modes were detected. Then, the index depth profiles were determined by reproducing the observed WG modes. The index changes were observed at three different depth regions; (i) a sharp dip at 13 μm in depth, which is attributed to the nuclear stopping <i>S</i><sub>n</sub> peak, (ii) a plateau near the surface between 0 and 3 μm in depth, which can be ascribed to the electronic stopping <i>S</i><sub>e</sub>, since <i>S</i><sub>e</sub> has a very broad peak at the surface, and (iii) a broad peak at 6 μm in depth. Since the last peak is ascribed to neither of <i>S</i><sub>e</sub> nor <i>S</i><sub>n</sub> peak, it could be attributed to the synergy effect of <i>S</i><sub>e</sub> and <i>S</i><sub>n.</sub> |
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issn | 2412-382X |
language | English |
last_indexed | 2024-03-10T14:49:27Z |
publishDate | 2020-11-01 |
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series | Quantum Beam Science |
spelling | doaj.art-150b85c4a1e54ba9b47dff091d7152482023-11-20T21:04:32ZengMDPI AGQuantum Beam Science2412-382X2020-11-01443910.3390/qubs4040039Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth ProfilingHiroshi Amekura0Rang Li1Nariaki Okubo2Norito Ishikawa3Feng Chen4National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0003, JapanSchool of Physics, State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, ChinaJapan Atomic Energy Agency (JAEA), Tokai, Ibaraki 319-1195, JapanJapan Atomic Energy Agency (JAEA), Tokai, Ibaraki 319-1195, JapanSchool of Physics, State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, ChinaEvolution of depth profiles of the refractive index in Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub> (YAG) crystals were studied under 200 MeV <sup>136</sup>Xe<sup>14+</sup> ion irradiation, since the index can be related with the stress change and/or the defect formation by the irradiation. Using the prism-coupling and the end-surface coupling methods, various waveguide (WG) modes were detected. Then, the index depth profiles were determined by reproducing the observed WG modes. The index changes were observed at three different depth regions; (i) a sharp dip at 13 μm in depth, which is attributed to the nuclear stopping <i>S</i><sub>n</sub> peak, (ii) a plateau near the surface between 0 and 3 μm in depth, which can be ascribed to the electronic stopping <i>S</i><sub>e</sub>, since <i>S</i><sub>e</sub> has a very broad peak at the surface, and (iii) a broad peak at 6 μm in depth. Since the last peak is ascribed to neither of <i>S</i><sub>e</sub> nor <i>S</i><sub>n</sub> peak, it could be attributed to the synergy effect of <i>S</i><sub>e</sub> and <i>S</i><sub>n.</sub>https://www.mdpi.com/2412-382X/4/4/39swift heavy ionYAG (Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub>)refractive index profilingsynergy effectoptical waveguide |
spellingShingle | Hiroshi Amekura Rang Li Nariaki Okubo Norito Ishikawa Feng Chen Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling Quantum Beam Science swift heavy ion YAG (Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub>) refractive index profiling synergy effect optical waveguide |
title | Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling |
title_full | Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling |
title_fullStr | Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling |
title_full_unstemmed | Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling |
title_short | Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling |
title_sort | irradiation effects of swift heavy ions detected by refractive index depth profiling |
topic | swift heavy ion YAG (Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub>) refractive index profiling synergy effect optical waveguide |
url | https://www.mdpi.com/2412-382X/4/4/39 |
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