High Power Self-Aligned, Trench-Implanted 4H-SiC JFETs
The process technology for the fabrication of 4H-SiC trenched-implanted-gate 4H–SiC vertical-channel JFET (TI-VJFET) has been developed. The optimized TIVJFETs have been fabricated with self-aligned nickel silicide source and gate contacts using a process sequence that greatly reduces process comple...
Main Authors: | Vamvoukakis K., Stavrinidis A., Stefanakis D., Konstantinidis G., Kayambaki M., Zekentes K. |
---|---|
Format: | Article |
Language: | English |
Published: |
EDP Sciences
2017-01-01
|
Series: | E3S Web of Conferences |
Online Access: | https://doi.org/10.1051/e3sconf/20171612001 |
Similar Items
-
Evaluation of accuracy of SiC-JFET macromodel
by: Bargieł Kamil, et al.
Published: (2018-01-01) -
A universal automatic and self‐powered gate driver power supply for normally‐ON SiC JFETs
by: Andreas Giannakis, et al.
Published: (2021-08-01) -
4H-SiC N-Channel JFET for Operation in High-Temperature Environments
by: Wei-Chen Lien, et al.
Published: (2014-01-01) -
A Novel SiC Trench MOSFET with Self-Aligned N-Type Ion Implantation Technique
by: Baozhu Wang, et al.
Published: (2023-12-01) -
The Effect of Deep JFET and P-Well Implant of 1.2kV 4H-SiC MOSFETs
by: Dongyoung Kim, et al.
Published: (2022-01-01)