Interferometric Instrument for Thickness Measurement on Blown Films
Real-time measurement of plastic film thickness during production is extremely important to guarantee planarity of the final film. Standard techniques are based on capacitive measurements, in close contact with the film. These techniques require continuous calibration and temperature compensation, w...
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Format: | Article |
Language: | English |
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MDPI AG
2021-06-01
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Series: | Photonics |
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Online Access: | https://www.mdpi.com/2304-6732/8/7/245 |
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author | Michele Norgia Alessandro Pesatori |
author_facet | Michele Norgia Alessandro Pesatori |
author_sort | Michele Norgia |
collection | DOAJ |
description | Real-time measurement of plastic film thickness during production is extremely important to guarantee planarity of the final film. Standard techniques are based on capacitive measurements, in close contact with the film. These techniques require continuous calibration and temperature compensation, while their contact can damage the film. Different optical contactless techniques are described in literature, but none has found application to real production, due to the strong vibration of the films. We propose a new structure of low-coherence fiber interferometer able to measure blown film thickness during productions. The novel fiber-optic setup is a cross between an autocorrelator and a white light interferometer, taking the advantages of both approaches. |
first_indexed | 2024-03-10T09:56:26Z |
format | Article |
id | doaj.art-175e4acf57a7466ba247f1d4e73d5ca6 |
institution | Directory Open Access Journal |
issn | 2304-6732 |
language | English |
last_indexed | 2024-03-10T09:56:26Z |
publishDate | 2021-06-01 |
publisher | MDPI AG |
record_format | Article |
series | Photonics |
spelling | doaj.art-175e4acf57a7466ba247f1d4e73d5ca62023-11-22T02:14:46ZengMDPI AGPhotonics2304-67322021-06-018724510.3390/photonics8070245Interferometric Instrument for Thickness Measurement on Blown FilmsMichele Norgia0Alessandro Pesatori1Politecnico di Milano, Dipartimento di Elettronica e Informazione e Bioingegneria (DEIB), Piazza Leonardo da Vinci 32, 20133 Milano, ItalyPolitecnico di Milano, Dipartimento di Elettronica e Informazione e Bioingegneria (DEIB), Piazza Leonardo da Vinci 32, 20133 Milano, ItalyReal-time measurement of plastic film thickness during production is extremely important to guarantee planarity of the final film. Standard techniques are based on capacitive measurements, in close contact with the film. These techniques require continuous calibration and temperature compensation, while their contact can damage the film. Different optical contactless techniques are described in literature, but none has found application to real production, due to the strong vibration of the films. We propose a new structure of low-coherence fiber interferometer able to measure blown film thickness during productions. The novel fiber-optic setup is a cross between an autocorrelator and a white light interferometer, taking the advantages of both approaches.https://www.mdpi.com/2304-6732/8/7/245low-coherence interferometrythickness measurementoptical coherence tomographyplastics measurement |
spellingShingle | Michele Norgia Alessandro Pesatori Interferometric Instrument for Thickness Measurement on Blown Films Photonics low-coherence interferometry thickness measurement optical coherence tomography plastics measurement |
title | Interferometric Instrument for Thickness Measurement on Blown Films |
title_full | Interferometric Instrument for Thickness Measurement on Blown Films |
title_fullStr | Interferometric Instrument for Thickness Measurement on Blown Films |
title_full_unstemmed | Interferometric Instrument for Thickness Measurement on Blown Films |
title_short | Interferometric Instrument for Thickness Measurement on Blown Films |
title_sort | interferometric instrument for thickness measurement on blown films |
topic | low-coherence interferometry thickness measurement optical coherence tomography plastics measurement |
url | https://www.mdpi.com/2304-6732/8/7/245 |
work_keys_str_mv | AT michelenorgia interferometricinstrumentforthicknessmeasurementonblownfilms AT alessandropesatori interferometricinstrumentforthicknessmeasurementonblownfilms |