Interferometric Instrument for Thickness Measurement on Blown Films

Real-time measurement of plastic film thickness during production is extremely important to guarantee planarity of the final film. Standard techniques are based on capacitive measurements, in close contact with the film. These techniques require continuous calibration and temperature compensation, w...

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Main Authors: Michele Norgia, Alessandro Pesatori
Format: Article
Language:English
Published: MDPI AG 2021-06-01
Series:Photonics
Subjects:
Online Access:https://www.mdpi.com/2304-6732/8/7/245
_version_ 1797528310819848192
author Michele Norgia
Alessandro Pesatori
author_facet Michele Norgia
Alessandro Pesatori
author_sort Michele Norgia
collection DOAJ
description Real-time measurement of plastic film thickness during production is extremely important to guarantee planarity of the final film. Standard techniques are based on capacitive measurements, in close contact with the film. These techniques require continuous calibration and temperature compensation, while their contact can damage the film. Different optical contactless techniques are described in literature, but none has found application to real production, due to the strong vibration of the films. We propose a new structure of low-coherence fiber interferometer able to measure blown film thickness during productions. The novel fiber-optic setup is a cross between an autocorrelator and a white light interferometer, taking the advantages of both approaches.
first_indexed 2024-03-10T09:56:26Z
format Article
id doaj.art-175e4acf57a7466ba247f1d4e73d5ca6
institution Directory Open Access Journal
issn 2304-6732
language English
last_indexed 2024-03-10T09:56:26Z
publishDate 2021-06-01
publisher MDPI AG
record_format Article
series Photonics
spelling doaj.art-175e4acf57a7466ba247f1d4e73d5ca62023-11-22T02:14:46ZengMDPI AGPhotonics2304-67322021-06-018724510.3390/photonics8070245Interferometric Instrument for Thickness Measurement on Blown FilmsMichele Norgia0Alessandro Pesatori1Politecnico di Milano, Dipartimento di Elettronica e Informazione e Bioingegneria (DEIB), Piazza Leonardo da Vinci 32, 20133 Milano, ItalyPolitecnico di Milano, Dipartimento di Elettronica e Informazione e Bioingegneria (DEIB), Piazza Leonardo da Vinci 32, 20133 Milano, ItalyReal-time measurement of plastic film thickness during production is extremely important to guarantee planarity of the final film. Standard techniques are based on capacitive measurements, in close contact with the film. These techniques require continuous calibration and temperature compensation, while their contact can damage the film. Different optical contactless techniques are described in literature, but none has found application to real production, due to the strong vibration of the films. We propose a new structure of low-coherence fiber interferometer able to measure blown film thickness during productions. The novel fiber-optic setup is a cross between an autocorrelator and a white light interferometer, taking the advantages of both approaches.https://www.mdpi.com/2304-6732/8/7/245low-coherence interferometrythickness measurementoptical coherence tomographyplastics measurement
spellingShingle Michele Norgia
Alessandro Pesatori
Interferometric Instrument for Thickness Measurement on Blown Films
Photonics
low-coherence interferometry
thickness measurement
optical coherence tomography
plastics measurement
title Interferometric Instrument for Thickness Measurement on Blown Films
title_full Interferometric Instrument for Thickness Measurement on Blown Films
title_fullStr Interferometric Instrument for Thickness Measurement on Blown Films
title_full_unstemmed Interferometric Instrument for Thickness Measurement on Blown Films
title_short Interferometric Instrument for Thickness Measurement on Blown Films
title_sort interferometric instrument for thickness measurement on blown films
topic low-coherence interferometry
thickness measurement
optical coherence tomography
plastics measurement
url https://www.mdpi.com/2304-6732/8/7/245
work_keys_str_mv AT michelenorgia interferometricinstrumentforthicknessmeasurementonblownfilms
AT alessandropesatori interferometricinstrumentforthicknessmeasurementonblownfilms