Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network

Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network

Many automated optical inspection (AOI) companies use supervised object detection networks to inspect items, a technique which expends tremendous time and energy to mark defectives. Therefore, we propose an AOI system which uses an unsupervised learning network as the base algorithm to simultaneousl...

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Bibliographic Details
Main Authors: Che-Hsuan Huang, Pei-Hsuan Lee, Shu-Hsiu Chang, Hao-Chung Kuo, Chia-Wei Sun, Chien-Chung Lin, Chun-Lin Tsai, Xinke Liu
Format: Article
Language:English
Published: MDPI AG 2021-08-01
Series:Crystals
Subjects:
abnormal detection
GAN
LED
machine learning
unsupervised learning
Online Access:https://www.mdpi.com/2073-4352/11/9/1048

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