Experimental Evidence for Coherent Perfect Absorption in Guided-Mode Resonant Silicon Films

We experimentally verify a new class of coherent absorbers based on guided-mode resonance effects in periodic thin films. We design a silicon-based resonant absorber that is fabricated and tested near the 1300-nm wavelength. Implementing phase control, the device can, in principle, be switched betwe...

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Main Authors: A. L. Fannin, J. W. Yoon, B. R. Wenner, J. W. Allen, M. S. Allen, R. Magnusson
Format: Article
Language:English
Published: IEEE 2016-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/7448825/
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author A. L. Fannin
J. W. Yoon
B. R. Wenner
J. W. Allen
M. S. Allen
R. Magnusson
author_facet A. L. Fannin
J. W. Yoon
B. R. Wenner
J. W. Allen
M. S. Allen
R. Magnusson
author_sort A. L. Fannin
collection DOAJ
description We experimentally verify a new class of coherent absorbers based on guided-mode resonance effects in periodic thin films. We design a silicon-based resonant absorber that is fabricated and tested near the 1300-nm wavelength. Implementing phase control, the device can, in principle, be switched between full absorption and full scattering. The first experimental prototype presented herein shows ~78% absorption in the in-phase state. Nearly total scattering is realized in the out-of-phase state. The experimental results agree reasonably well with theory.
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spelling doaj.art-17d89510f8774fb98c9268a45592711b2022-12-21T23:06:36ZengIEEEIEEE Photonics Journal1943-06552016-01-01831710.1109/JPHOT.2016.25521607448825Experimental Evidence for Coherent Perfect Absorption in Guided-Mode Resonant Silicon FilmsA. L. Fannin0J. W. Yoon1B. R. Wenner2J. W. Allen3M. S. Allen4R. Magnusson5Department of Electrical Engineering, The University of Texas at Arlington, Arlington, TX, USADepartment of Electrical Engineering, The University of Texas at Arlington, Arlington, TX, USAAir Force Research Laboratory Sensors Directorate, Wright-Patterson Air Force Base, OH, USAAir Force Research Laboratory Munitions Directorate, Eglin Air Force Base, FL, USAAir Force Research Laboratory Munitions Directorate, Eglin Air Force Base, FL, USADepartment of Electrical Engineering, The University of Texas at Arlington, Arlington, TX, USAWe experimentally verify a new class of coherent absorbers based on guided-mode resonance effects in periodic thin films. We design a silicon-based resonant absorber that is fabricated and tested near the 1300-nm wavelength. Implementing phase control, the device can, in principle, be switched between full absorption and full scattering. The first experimental prototype presented herein shows ~78% absorption in the in-phase state. Nearly total scattering is realized in the out-of-phase state. The experimental results agree reasonably well with theory.https://ieeexplore.ieee.org/document/7448825/Temporal coherenceguided-mode resonance (GMR)subwavelength structuresspatial coherencecoherence, absorptionabsorption
spellingShingle A. L. Fannin
J. W. Yoon
B. R. Wenner
J. W. Allen
M. S. Allen
R. Magnusson
Experimental Evidence for Coherent Perfect Absorption in Guided-Mode Resonant Silicon Films
IEEE Photonics Journal
Temporal coherence
guided-mode resonance (GMR)
subwavelength structures
spatial coherence
coherence, absorption
absorption
title Experimental Evidence for Coherent Perfect Absorption in Guided-Mode Resonant Silicon Films
title_full Experimental Evidence for Coherent Perfect Absorption in Guided-Mode Resonant Silicon Films
title_fullStr Experimental Evidence for Coherent Perfect Absorption in Guided-Mode Resonant Silicon Films
title_full_unstemmed Experimental Evidence for Coherent Perfect Absorption in Guided-Mode Resonant Silicon Films
title_short Experimental Evidence for Coherent Perfect Absorption in Guided-Mode Resonant Silicon Films
title_sort experimental evidence for coherent perfect absorption in guided mode resonant silicon films
topic Temporal coherence
guided-mode resonance (GMR)
subwavelength structures
spatial coherence
coherence, absorption
absorption
url https://ieeexplore.ieee.org/document/7448825/
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