Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study
Defects are an integral part of the structure of various two-dimensional materials (2D), including 2D transition-metal dichalcogenides. These defects usually govern their electronic properties. In this work, simulations based on the density functional theory are employed for a comprehensive characte...
Main Author: | |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2024-01-01
|
Series: | Applied Sciences |
Subjects: | |
Online Access: | https://www.mdpi.com/2076-3417/14/3/1205 |
_version_ | 1797318982527614976 |
---|---|
author | Andrey A. Kistanov |
author_facet | Andrey A. Kistanov |
author_sort | Andrey A. Kistanov |
collection | DOAJ |
description | Defects are an integral part of the structure of various two-dimensional materials (2D), including 2D transition-metal dichalcogenides. These defects usually govern their electronic properties. In this work, simulations based on the density functional theory are employed for a comprehensive characterization of typical point defects in the T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers. Specifically, Se and V monovacancy defects are studied. The formation of monovacancies in T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers are found to be less favorable than in other common transition-metal dichalcogenides. Meanwhile, Se and V monovacancy defects tune the electronic structure of the T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers significantly. The scanning tunneling microscopy simulated images obtained could facilitate the detection of monovacancies in T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers in experiments. |
first_indexed | 2024-03-08T04:00:14Z |
format | Article |
id | doaj.art-1804fa58ccde4d06a66881ad18dc8a49 |
institution | Directory Open Access Journal |
issn | 2076-3417 |
language | English |
last_indexed | 2024-03-08T04:00:14Z |
publishDate | 2024-01-01 |
publisher | MDPI AG |
record_format | Article |
series | Applied Sciences |
spelling | doaj.art-1804fa58ccde4d06a66881ad18dc8a492024-02-09T15:08:13ZengMDPI AGApplied Sciences2076-34172024-01-01143120510.3390/app14031205Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT StudyAndrey A. Kistanov0Institute for Metals Superplasticity Problems, Russian Academy of Sciences, 450001 Ufa, RussiaDefects are an integral part of the structure of various two-dimensional materials (2D), including 2D transition-metal dichalcogenides. These defects usually govern their electronic properties. In this work, simulations based on the density functional theory are employed for a comprehensive characterization of typical point defects in the T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers. Specifically, Se and V monovacancy defects are studied. The formation of monovacancies in T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers are found to be less favorable than in other common transition-metal dichalcogenides. Meanwhile, Se and V monovacancy defects tune the electronic structure of the T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers significantly. The scanning tunneling microscopy simulated images obtained could facilitate the detection of monovacancies in T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers in experiments.https://www.mdpi.com/2076-3417/14/3/1205DFTelectronic propertiesSTMmonovacancymigration barrier |
spellingShingle | Andrey A. Kistanov Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study Applied Sciences DFT electronic properties STM monovacancy migration barrier |
title | Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study |
title_full | Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study |
title_fullStr | Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study |
title_full_unstemmed | Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study |
title_short | Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study |
title_sort | characterization of monovacancy defects in vanadium diselenide monolayer a dft study |
topic | DFT electronic properties STM monovacancy migration barrier |
url | https://www.mdpi.com/2076-3417/14/3/1205 |
work_keys_str_mv | AT andreyakistanov characterizationofmonovacancydefectsinvanadiumdiselenidemonolayeradftstudy |