Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study

Defects are an integral part of the structure of various two-dimensional materials (2D), including 2D transition-metal dichalcogenides. These defects usually govern their electronic properties. In this work, simulations based on the density functional theory are employed for a comprehensive characte...

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Main Author: Andrey A. Kistanov
Format: Article
Language:English
Published: MDPI AG 2024-01-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/14/3/1205
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author Andrey A. Kistanov
author_facet Andrey A. Kistanov
author_sort Andrey A. Kistanov
collection DOAJ
description Defects are an integral part of the structure of various two-dimensional materials (2D), including 2D transition-metal dichalcogenides. These defects usually govern their electronic properties. In this work, simulations based on the density functional theory are employed for a comprehensive characterization of typical point defects in the T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers. Specifically, Se and V monovacancy defects are studied. The formation of monovacancies in T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers are found to be less favorable than in other common transition-metal dichalcogenides. Meanwhile, Se and V monovacancy defects tune the electronic structure of the T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers significantly. The scanning tunneling microscopy simulated images obtained could facilitate the detection of monovacancies in T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers in experiments.
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spelling doaj.art-1804fa58ccde4d06a66881ad18dc8a492024-02-09T15:08:13ZengMDPI AGApplied Sciences2076-34172024-01-01143120510.3390/app14031205Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT StudyAndrey A. Kistanov0Institute for Metals Superplasticity Problems, Russian Academy of Sciences, 450001 Ufa, RussiaDefects are an integral part of the structure of various two-dimensional materials (2D), including 2D transition-metal dichalcogenides. These defects usually govern their electronic properties. In this work, simulations based on the density functional theory are employed for a comprehensive characterization of typical point defects in the T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers. Specifically, Se and V monovacancy defects are studied. The formation of monovacancies in T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers are found to be less favorable than in other common transition-metal dichalcogenides. Meanwhile, Se and V monovacancy defects tune the electronic structure of the T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers significantly. The scanning tunneling microscopy simulated images obtained could facilitate the detection of monovacancies in T–VSe<sub>2</sub> and H–VSe<sub>2</sub> monolayers in experiments.https://www.mdpi.com/2076-3417/14/3/1205DFTelectronic propertiesSTMmonovacancymigration barrier
spellingShingle Andrey A. Kistanov
Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study
Applied Sciences
DFT
electronic properties
STM
monovacancy
migration barrier
title Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study
title_full Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study
title_fullStr Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study
title_full_unstemmed Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study
title_short Characterization of Monovacancy Defects in Vanadium Diselenide Monolayer: A DFT Study
title_sort characterization of monovacancy defects in vanadium diselenide monolayer a dft study
topic DFT
electronic properties
STM
monovacancy
migration barrier
url https://www.mdpi.com/2076-3417/14/3/1205
work_keys_str_mv AT andreyakistanov characterizationofmonovacancydefectsinvanadiumdiselenidemonolayeradftstudy