Silicon-Quantum-Dot Light-Emitting Diodes With Interlayer-Enhanced Hole Transport

Despite the technological importance of silicon quantum dots (Si QDs) which are solely made of abundant and nontoxic Si, Si-QD light-emitting diodes (LEDs) clearly lag behind those based on other QDs, especially Cd- or Pb-containing QDs. It is imperative that novel measures should be taken to boost...

Full description

Bibliographic Details
Main Authors: Wei Gu, Xiangkai Liu, Xiaodong Pi, Xingliang Dai, Shuangyi Zhao, Li Yao, Dongsheng Li, Yizheng Jin, Mingsheng Xu, Deren Yang, Guogang Qin
Format: Article
Language:English
Published: IEEE 2017-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/7858634/
_version_ 1818603053479100416
author Wei Gu
Xiangkai Liu
Xiaodong Pi
Xingliang Dai
Shuangyi Zhao
Li Yao
Dongsheng Li
Yizheng Jin
Mingsheng Xu
Deren Yang
Guogang Qin
author_facet Wei Gu
Xiangkai Liu
Xiaodong Pi
Xingliang Dai
Shuangyi Zhao
Li Yao
Dongsheng Li
Yizheng Jin
Mingsheng Xu
Deren Yang
Guogang Qin
author_sort Wei Gu
collection DOAJ
description Despite the technological importance of silicon quantum dots (Si QDs) which are solely made of abundant and nontoxic Si, Si-QD light-emitting diodes (LEDs) clearly lag behind those based on other QDs, especially Cd- or Pb-containing QDs. It is imperative that novel measures should be taken to boost the performance of Si-QD LEDs. Here, we demonstrate that Si-QD LEDs can work much more efficiently after the use of interlayers between indium tin oxide (ITO) and poly(ethylene-dioxythiophene):polystyrene sulphonate (PEDOT:PSS) to enhance the hole transport of the devices. The interlayer of dipyrazino (2, 3-f:2 ', 3 '-h) quinoxaline-2,3,6,7,10,11-hexacarbonitrile (HAT-CN) or MoO3 increases the work function of ITO and improves the band alignment, leading to better hole injection from ITO to PEDOT:PSS. The resulting mitigated charge unbalance causes both the external quantum efficiency (EQE) and stability of Si-QD LEDs to significantly increase (up to ~170% for EQE and ~240% for device half-lifetime). The highest EQE of ~2.4% obtained in the current work is among the best values that have been reported for Si-QD LEDs. Even without encapsulation, the device half-lifetime is up to ~8.5 h. The enhancement of the hole transport induced by MoO3 is more significant than that induced by HAT-CN. Therefore, MoO3 more significantly enhances the performance of Si-QD LEDs than HAT-CN.
first_indexed 2024-12-16T13:17:03Z
format Article
id doaj.art-1827370d330c48ed8c7db721ec3e5f1d
institution Directory Open Access Journal
issn 1943-0655
language English
last_indexed 2024-12-16T13:17:03Z
publishDate 2017-01-01
publisher IEEE
record_format Article
series IEEE Photonics Journal
spelling doaj.art-1827370d330c48ed8c7db721ec3e5f1d2022-12-21T22:30:26ZengIEEEIEEE Photonics Journal1943-06552017-01-019211010.1109/JPHOT.2017.26710237858634Silicon-Quantum-Dot Light-Emitting Diodes With Interlayer-Enhanced Hole TransportWei Gu0Xiangkai Liu1Xiaodong Pi2Xingliang Dai3Shuangyi Zhao4Li Yao5Dongsheng Li6Yizheng Jin7Mingsheng Xu8Deren Yang9Guogang Qin10State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, Zhejiang, ChinaState Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, Zhejiang, ChinaState Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, Zhejiang, ChinaCenter for Chemistry of High-Performance & Novel Materials, State Key Laboratory of Silicon Materials, Department of Chemistry, Zhejiang University, Hangzhou, Zhejiang, ChinaState Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, Zhejiang, ChinaState Key Laboratory of Silicon Materials, College of Information Science & Electronic Engineering, Zhejiang University, Hangzhou, Zhejiang, ChinaState Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, Zhejiang, ChinaCenter for Chemistry of High-Performance & Novel Materials, State Key Laboratory of Silicon Materials, Department of Chemistry, Zhejiang University, Hangzhou, Zhejiang, ChinaState Key Laboratory for Mesoscopic Physics, School of Physics, Peking University, Beijing, ChinaState Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, Zhejiang, ChinaState Key Laboratory of Silicon Materials, College of Information Science & Electronic Engineering, Zhejiang University, Hangzhou, Zhejiang, ChinaDespite the technological importance of silicon quantum dots (Si QDs) which are solely made of abundant and nontoxic Si, Si-QD light-emitting diodes (LEDs) clearly lag behind those based on other QDs, especially Cd- or Pb-containing QDs. It is imperative that novel measures should be taken to boost the performance of Si-QD LEDs. Here, we demonstrate that Si-QD LEDs can work much more efficiently after the use of interlayers between indium tin oxide (ITO) and poly(ethylene-dioxythiophene):polystyrene sulphonate (PEDOT:PSS) to enhance the hole transport of the devices. The interlayer of dipyrazino (2, 3-f:2 ', 3 '-h) quinoxaline-2,3,6,7,10,11-hexacarbonitrile (HAT-CN) or MoO3 increases the work function of ITO and improves the band alignment, leading to better hole injection from ITO to PEDOT:PSS. The resulting mitigated charge unbalance causes both the external quantum efficiency (EQE) and stability of Si-QD LEDs to significantly increase (up to ~170% for EQE and ~240% for device half-lifetime). The highest EQE of ~2.4% obtained in the current work is among the best values that have been reported for Si-QD LEDs. Even without encapsulation, the device half-lifetime is up to ~8.5 h. The enhancement of the hole transport induced by MoO3 is more significant than that induced by HAT-CN. Therefore, MoO3 more significantly enhances the performance of Si-QD LEDs than HAT-CN.https://ieeexplore.ieee.org/document/7858634/Silicon quantum dots (Si QDs)light-emitting diodes (LEDs)interlayerhole transport
spellingShingle Wei Gu
Xiangkai Liu
Xiaodong Pi
Xingliang Dai
Shuangyi Zhao
Li Yao
Dongsheng Li
Yizheng Jin
Mingsheng Xu
Deren Yang
Guogang Qin
Silicon-Quantum-Dot Light-Emitting Diodes With Interlayer-Enhanced Hole Transport
IEEE Photonics Journal
Silicon quantum dots (Si QDs)
light-emitting diodes (LEDs)
interlayer
hole transport
title Silicon-Quantum-Dot Light-Emitting Diodes With Interlayer-Enhanced Hole Transport
title_full Silicon-Quantum-Dot Light-Emitting Diodes With Interlayer-Enhanced Hole Transport
title_fullStr Silicon-Quantum-Dot Light-Emitting Diodes With Interlayer-Enhanced Hole Transport
title_full_unstemmed Silicon-Quantum-Dot Light-Emitting Diodes With Interlayer-Enhanced Hole Transport
title_short Silicon-Quantum-Dot Light-Emitting Diodes With Interlayer-Enhanced Hole Transport
title_sort silicon quantum dot light emitting diodes with interlayer enhanced hole transport
topic Silicon quantum dots (Si QDs)
light-emitting diodes (LEDs)
interlayer
hole transport
url https://ieeexplore.ieee.org/document/7858634/
work_keys_str_mv AT weigu siliconquantumdotlightemittingdiodeswithinterlayerenhancedholetransport
AT xiangkailiu siliconquantumdotlightemittingdiodeswithinterlayerenhancedholetransport
AT xiaodongpi siliconquantumdotlightemittingdiodeswithinterlayerenhancedholetransport
AT xingliangdai siliconquantumdotlightemittingdiodeswithinterlayerenhancedholetransport
AT shuangyizhao siliconquantumdotlightemittingdiodeswithinterlayerenhancedholetransport
AT liyao siliconquantumdotlightemittingdiodeswithinterlayerenhancedholetransport
AT dongshengli siliconquantumdotlightemittingdiodeswithinterlayerenhancedholetransport
AT yizhengjin siliconquantumdotlightemittingdiodeswithinterlayerenhancedholetransport
AT mingshengxu siliconquantumdotlightemittingdiodeswithinterlayerenhancedholetransport
AT derenyang siliconquantumdotlightemittingdiodeswithinterlayerenhancedholetransport
AT guogangqin siliconquantumdotlightemittingdiodeswithinterlayerenhancedholetransport