Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement

Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement

In white-light interference microscopy, measurement of surface shape generally requires peak extraction of the fringe function envelope. In this paper the Teager-Kaiser energy and higher-order energy operators are proposed for efficient extraction of the fringe envelope. These energy operators are c...

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Bibliographic Details
Main Authors: Abdel-Ouahab Boudraa, Denis Montaner, Paul C. Montgomery, Fabien Salzenstein
Format: Article
Language:English
Published: SpringerOpen 2005-10-01
Series:EURASIP Journal on Advances in Signal Processing
Subjects:
Teager-Kaiser energy
higher-order operators
white-light interferometry
subsampling.
Online Access:http://dx.doi.org/10.1155/ASP.2005.2804

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