Perancangan Perangkat Lunak untuk Ekstraksi Ciri dan Klasifikasi Pola Batik

<p class="abstract"><span>The popularity of batik patterns in Indonesia has varied. Industrial modern devices in imaging have supported batik pattern recognition and classification. The important of product pattern information could not naturally visible. The information about...

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Main Author: Indah Soesanti
Format: Article
Language:English
Published: Universitas Muhammadiyah Yogyakarta 2015-11-01
Series:Semesta Teknika
Online Access:https://journal.umy.ac.id/index.php/st/article/view/424
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author Indah Soesanti
author_facet Indah Soesanti
author_sort Indah Soesanti
collection DOAJ
description <p class="abstract"><span>The popularity of batik patterns in Indonesia has varied. Industrial modern devices in imaging have supported batik pattern recognition and classification. The important of product pattern information could not naturally visible. The information about batik pattern can be achieved by using the appropriate software design of image processing for extracting the features. One of the potential procedures is the unsupervised classification method based on specific feature.  In this research, the specific feature extraction based on the eigenimage of batik pattern was done. In the final step, the nearest distance eigenimage between reference batik image and test batik image was used to identify the batik from the classical pattern field point of view. The results of batik image identification conformed 96.67% with the reference batik images.</span></p>
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spelling doaj.art-187862bc7aba4fab907754130236a93e2022-12-22T01:00:04ZengUniversitas Muhammadiyah YogyakartaSemesta Teknika1411-061X2502-54812015-11-01172157165362Perancangan Perangkat Lunak untuk Ekstraksi Ciri dan Klasifikasi Pola BatikIndah Soesanti0Universitas Gadjah Mada<p class="abstract"><span>The popularity of batik patterns in Indonesia has varied. Industrial modern devices in imaging have supported batik pattern recognition and classification. The important of product pattern information could not naturally visible. The information about batik pattern can be achieved by using the appropriate software design of image processing for extracting the features. One of the potential procedures is the unsupervised classification method based on specific feature.  In this research, the specific feature extraction based on the eigenimage of batik pattern was done. In the final step, the nearest distance eigenimage between reference batik image and test batik image was used to identify the batik from the classical pattern field point of view. The results of batik image identification conformed 96.67% with the reference batik images.</span></p>https://journal.umy.ac.id/index.php/st/article/view/424
spellingShingle Indah Soesanti
Perancangan Perangkat Lunak untuk Ekstraksi Ciri dan Klasifikasi Pola Batik
Semesta Teknika
title Perancangan Perangkat Lunak untuk Ekstraksi Ciri dan Klasifikasi Pola Batik
title_full Perancangan Perangkat Lunak untuk Ekstraksi Ciri dan Klasifikasi Pola Batik
title_fullStr Perancangan Perangkat Lunak untuk Ekstraksi Ciri dan Klasifikasi Pola Batik
title_full_unstemmed Perancangan Perangkat Lunak untuk Ekstraksi Ciri dan Klasifikasi Pola Batik
title_short Perancangan Perangkat Lunak untuk Ekstraksi Ciri dan Klasifikasi Pola Batik
title_sort perancangan perangkat lunak untuk ekstraksi ciri dan klasifikasi pola batik
url https://journal.umy.ac.id/index.php/st/article/view/424
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