Automated detection and removal of flat line segments and large amplitude fluctuations in neonatal electroencephalography
Background Artefact removal in neonatal electroencephalography (EEG) by visual inspection generally depends on the expertise of the operator, is time consuming and is not a consistent pre-processing step to the pipeline for the automated EEG analysis. Therefore, there is the need for the automated d...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
PeerJ Inc.
2022-07-01
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| Series: | PeerJ |
| Subjects: | |
| Online Access: | https://peerj.com/articles/13734.pdf |