Real-space light-reflection mapping of atomically thin WSe2 flakes revealing the gradient local strain
The spatially continuous control of the physical properties in semiconductor materials is an important strategy in increasing electron-capturing or light-harvesting efficiencies, which is highly desirable for the application of optoelectronic devices including photodetectors, solar cells and biosens...
Main Authors: | Yang Guo, Yuan Huang, Shuo Du, Chi Sun, Shibing Tian, Hailan Luo, Baoli Liu, Xingjiang Zhou, Junjie Li, Changzhi Gu |
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Format: | Article |
Language: | English |
Published: |
IOP Publishing
2020-01-01
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Series: | Materials Research Express |
Subjects: | |
Online Access: | https://doi.org/10.1088/2053-1591/ab7d09 |
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