A Non-Contact Measuring System for In-Situ Surface Characterization Based on Laser Confocal Microscopy

A Non-Contact Measuring System for In-Situ Surface Characterization Based on Laser Confocal Microscopy

The characterization of surface topographic features on a component is typically quantified using two-dimensional roughness descriptors which are captured by off-line desktop instruments. Ideally any measurement system should be integrated into the manufacturing process to provide in-situ measuremen...

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Bibliographic Details
Main Authors: Shaowei Fu, Fang Cheng, Tegoeh Tjahjowidodo, Yu Zhou, David Butler
Format: Article
Language:English
Published: MDPI AG 2018-08-01
Series:Sensors
Subjects:
surface roughness
non-contact
in-situ measurement
error correction
Online Access:http://www.mdpi.com/1424-8220/18/8/2657

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