Modelling of Failure Effect to Integrity of System

<p>The interlocking systems are typically resisting against hazardous faults. Failure effect on the system can be determined directly by monitoring the original system installation, by simulation of the system operation using its model, or by computing or theoretical reasoning. The process of...

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Bibliographic Details
Main Author: Karol Rastocny
Format: Article
Language:English
Published: VSB-Technical University of Ostrava 2004-01-01
Series:Advances in Electrical and Electronic Engineering
Subjects:
Online Access:http://advances.utc.sk/index.php/AEEE/article/view/386
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author Karol Rastocny
author_facet Karol Rastocny
author_sort Karol Rastocny
collection DOAJ
description <p>The interlocking systems are typically resisting against hazardous faults. Failure effect on the system can be determined directly by monitoring the original system installation, by simulation of the system operation using its model, or by computing or theoretical reasoning. The process of system ageing can be described with the help of the random failure time. Essential majorities of computer-based interlocking system elements are electronic elements that are not exposed to mechanical wear. The failure distribution of these elements is assumed to be exponential.</p><p> </p><p> </p><p> </p>
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spelling doaj.art-1a87a941ec134c38ad2234f3c26957412023-05-14T20:50:07ZengVSB-Technical University of OstravaAdvances in Electrical and Electronic Engineering1336-13761804-31192004-01-01329194430Modelling of Failure Effect to Integrity of SystemKarol Rastocny0University of Zilina<p>The interlocking systems are typically resisting against hazardous faults. Failure effect on the system can be determined directly by monitoring the original system installation, by simulation of the system operation using its model, or by computing or theoretical reasoning. The process of system ageing can be described with the help of the random failure time. Essential majorities of computer-based interlocking system elements are electronic elements that are not exposed to mechanical wear. The failure distribution of these elements is assumed to be exponential.</p><p> </p><p> </p><p> </p>http://advances.utc.sk/index.php/AEEE/article/view/386faultselectronic elementsmodelmechanical wear.
spellingShingle Karol Rastocny
Modelling of Failure Effect to Integrity of System
Advances in Electrical and Electronic Engineering
faults
electronic elements
model
mechanical wear.
title Modelling of Failure Effect to Integrity of System
title_full Modelling of Failure Effect to Integrity of System
title_fullStr Modelling of Failure Effect to Integrity of System
title_full_unstemmed Modelling of Failure Effect to Integrity of System
title_short Modelling of Failure Effect to Integrity of System
title_sort modelling of failure effect to integrity of system
topic faults
electronic elements
model
mechanical wear.
url http://advances.utc.sk/index.php/AEEE/article/view/386
work_keys_str_mv AT karolrastocny modellingoffailureeffecttointegrityofsystem