Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy
We present a detailed study of compressively strained PbxSr1−xTiO3 thin films grown by off-axis radio frequency magnetron sputtering on (001)-oriented Nb-doped SrTiO3 substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thic...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2016-08-01
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| Series: | APL Materials |
| Online Access: | http://dx.doi.org/10.1063/1.4960621 |
| _version_ | 1818269804033736704 |
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| author | S. Fernandez-Peña C. Lichtensteiger P. Zubko C. Weymann S. Gariglio J.-M. Triscone |
| author_facet | S. Fernandez-Peña C. Lichtensteiger P. Zubko C. Weymann S. Gariglio J.-M. Triscone |
| author_sort | S. Fernandez-Peña |
| collection | DOAJ |
| description | We present a detailed study of compressively strained PbxSr1−xTiO3 thin films grown by off-axis radio frequency magnetron sputtering on (001)-oriented Nb-doped SrTiO3 substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thickness and compared with a phenomenological Landau-Devonshire model. 180∘ ferroelectric domains are observed using both X-ray diffraction and piezoresponse force microscopy and domain sizes obtained by the two techniques are compared and discussed. |
| first_indexed | 2024-12-12T21:00:12Z |
| format | Article |
| id | doaj.art-1aee3652ca3c489c9343aedc42d4cdc8 |
| institution | Directory Open Access Journal |
| issn | 2166-532X |
| language | English |
| last_indexed | 2024-12-12T21:00:12Z |
| publishDate | 2016-08-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | APL Materials |
| spelling | doaj.art-1aee3652ca3c489c9343aedc42d4cdc82022-12-22T00:12:09ZengAIP Publishing LLCAPL Materials2166-532X2016-08-0148086105086105-810.1063/1.4960621007608APMFerroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopyS. Fernandez-Peña0C. Lichtensteiger1P. Zubko2C. Weymann3S. Gariglio4J.-M. Triscone5DQMP, University of Geneva, 24 Quai E. Ansermet, 1211 Geneva 4, SwitzerlandDQMP, University of Geneva, 24 Quai E. Ansermet, 1211 Geneva 4, SwitzerlandLondon Centre for Nanotechnology and Department of Physics and Astronomy, University College London, 17–19 Gordon Street, London WC1H 0HA, United KingdomDQMP, University of Geneva, 24 Quai E. Ansermet, 1211 Geneva 4, SwitzerlandDQMP, University of Geneva, 24 Quai E. Ansermet, 1211 Geneva 4, SwitzerlandDQMP, University of Geneva, 24 Quai E. Ansermet, 1211 Geneva 4, SwitzerlandWe present a detailed study of compressively strained PbxSr1−xTiO3 thin films grown by off-axis radio frequency magnetron sputtering on (001)-oriented Nb-doped SrTiO3 substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thickness and compared with a phenomenological Landau-Devonshire model. 180∘ ferroelectric domains are observed using both X-ray diffraction and piezoresponse force microscopy and domain sizes obtained by the two techniques are compared and discussed.http://dx.doi.org/10.1063/1.4960621 |
| spellingShingle | S. Fernandez-Peña C. Lichtensteiger P. Zubko C. Weymann S. Gariglio J.-M. Triscone Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy APL Materials |
| title | Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy |
| title_full | Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy |
| title_fullStr | Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy |
| title_full_unstemmed | Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy |
| title_short | Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy |
| title_sort | ferroelectric domains in epitaxial pbxsr1 xtio3 thin films investigated using x ray diffraction and piezoresponse force microscopy |
| url | http://dx.doi.org/10.1063/1.4960621 |
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