SPIN COATED TANTALUM-TIN OXIDE THIN FILM PREPARED USING TANTALUM-TIN ACETYLACETONATE AS PRECURSOR
A single source precursor, tantalum tin acetylacetonate was prepared and characterized by Fourier transform infrared (FTIR) spectroscopy. Tantalum tin oxide thin film was deposited on ITO coated glass substrate through spin coating of the single source precursor solution and annealed at a temperatur...
| Main Authors: | , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Politehnium Publishing House
2017-09-01
|
| Series: | European Journal of Materials Science and Engineering |
| Subjects: | |
| Online Access: | http://ejmse.tuiasi.ro/articles/EJMSE_02_02-3_06_Adesanlu.pdf |
| _version_ | 1818232893158195200 |
|---|---|
| author | Olawale Simbo ADESANLU Marcus Adebola ELERUJA Victor ADEDEJI Oladepo FASAKIN Bolutife OLOFINJANA Eusebis Ikechukwu OBIAJUNWA Ezekiel Oladele Bolarinwa AJAYI |
| author_facet | Olawale Simbo ADESANLU Marcus Adebola ELERUJA Victor ADEDEJI Oladepo FASAKIN Bolutife OLOFINJANA Eusebis Ikechukwu OBIAJUNWA Ezekiel Oladele Bolarinwa AJAYI |
| author_sort | Olawale Simbo ADESANLU |
| collection | DOAJ |
| description | A single source precursor, tantalum tin acetylacetonate was prepared and characterized by Fourier transform infrared (FTIR) spectroscopy. Tantalum tin oxide thin film was deposited on ITO coated glass substrate through spin coating of the single source precursor solution and annealed at a temperature of 420 o C.The deposited film was characterized using Rutherford backscattering spectroscopy (RBS), scanning electron microscopy (SEM), X-ray diffractometry (XRD), optical absorption spectroscopy, and four point probe technique. RBS analysis showed that the film have a stoichiometry of Ta0.2Sn0.8O2 and thickness of 8.225 nm. SEM micrograph of the film revealed closely packed grains which are well distributed over the entire substrate while the XRD indicated strong reflections from planes that correspond to both tetragonal rutile SnO2 and Ta2O5 structures. The absorption behavior of the deposited thin film was relatively stable under different temperature with direct optical band gap between 3.44 and 3.54 eV. The resistivity was found to be of the order of 10-4 Ω-cm. |
| first_indexed | 2024-12-12T11:13:31Z |
| format | Article |
| id | doaj.art-1b9e0525a2504ad5ba722b9f74025fee |
| institution | Directory Open Access Journal |
| issn | 2537-4338 2537-4346 |
| language | English |
| last_indexed | 2024-12-12T11:13:31Z |
| publishDate | 2017-09-01 |
| publisher | Politehnium Publishing House |
| record_format | Article |
| series | European Journal of Materials Science and Engineering |
| spelling | doaj.art-1b9e0525a2504ad5ba722b9f74025fee2022-12-22T00:26:14ZengPolitehnium Publishing HouseEuropean Journal of Materials Science and Engineering2537-43382537-43462017-09-01238395SPIN COATED TANTALUM-TIN OXIDE THIN FILM PREPARED USING TANTALUM-TIN ACETYLACETONATE AS PRECURSOROlawale Simbo ADESANLU0 Marcus Adebola ELERUJA1Victor ADEDEJI2Oladepo FASAKIN3Bolutife OLOFINJANA4Eusebis Ikechukwu OBIAJUNWA5 Ezekiel Oladele Bolarinwa AJAYI 6Deparment of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife, 220005, Nigeria Deparment of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife, 220005, Nigeria Department of Chemistry and Physics, Elizabeth City State University, Elizabeth City, NC, USA Deparment of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife, 220005, Nigeria Deparment of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife, 220005, Nigeria Center for Energy Research and Development, Obafemi Awolowo University, Ile-Ife, Nigeria Deparment of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife, 220005, Nigeria A single source precursor, tantalum tin acetylacetonate was prepared and characterized by Fourier transform infrared (FTIR) spectroscopy. Tantalum tin oxide thin film was deposited on ITO coated glass substrate through spin coating of the single source precursor solution and annealed at a temperature of 420 o C.The deposited film was characterized using Rutherford backscattering spectroscopy (RBS), scanning electron microscopy (SEM), X-ray diffractometry (XRD), optical absorption spectroscopy, and four point probe technique. RBS analysis showed that the film have a stoichiometry of Ta0.2Sn0.8O2 and thickness of 8.225 nm. SEM micrograph of the film revealed closely packed grains which are well distributed over the entire substrate while the XRD indicated strong reflections from planes that correspond to both tetragonal rutile SnO2 and Ta2O5 structures. The absorption behavior of the deposited thin film was relatively stable under different temperature with direct optical band gap between 3.44 and 3.54 eV. The resistivity was found to be of the order of 10-4 Ω-cm.http://ejmse.tuiasi.ro/articles/EJMSE_02_02-3_06_Adesanlu.pdfprecursortantalum tin acetylacetonatetantalum tin oxidethin filmSpin coatingcharacterization |
| spellingShingle | Olawale Simbo ADESANLU Marcus Adebola ELERUJA Victor ADEDEJI Oladepo FASAKIN Bolutife OLOFINJANA Eusebis Ikechukwu OBIAJUNWA Ezekiel Oladele Bolarinwa AJAYI SPIN COATED TANTALUM-TIN OXIDE THIN FILM PREPARED USING TANTALUM-TIN ACETYLACETONATE AS PRECURSOR European Journal of Materials Science and Engineering precursor tantalum tin acetylacetonate tantalum tin oxide thin film Spin coating characterization |
| title | SPIN COATED TANTALUM-TIN OXIDE THIN FILM PREPARED USING TANTALUM-TIN ACETYLACETONATE AS PRECURSOR |
| title_full | SPIN COATED TANTALUM-TIN OXIDE THIN FILM PREPARED USING TANTALUM-TIN ACETYLACETONATE AS PRECURSOR |
| title_fullStr | SPIN COATED TANTALUM-TIN OXIDE THIN FILM PREPARED USING TANTALUM-TIN ACETYLACETONATE AS PRECURSOR |
| title_full_unstemmed | SPIN COATED TANTALUM-TIN OXIDE THIN FILM PREPARED USING TANTALUM-TIN ACETYLACETONATE AS PRECURSOR |
| title_short | SPIN COATED TANTALUM-TIN OXIDE THIN FILM PREPARED USING TANTALUM-TIN ACETYLACETONATE AS PRECURSOR |
| title_sort | spin coated tantalum tin oxide thin film prepared using tantalum tin acetylacetonate as precursor |
| topic | precursor tantalum tin acetylacetonate tantalum tin oxide thin film Spin coating characterization |
| url | http://ejmse.tuiasi.ro/articles/EJMSE_02_02-3_06_Adesanlu.pdf |
| work_keys_str_mv | AT olawalesimboadesanlu spincoatedtantalumtinoxidethinfilmpreparedusingtantalumtinacetylacetonateasprecursor AT marcusadebolaeleruja spincoatedtantalumtinoxidethinfilmpreparedusingtantalumtinacetylacetonateasprecursor AT victoradedeji spincoatedtantalumtinoxidethinfilmpreparedusingtantalumtinacetylacetonateasprecursor AT oladepofasakin spincoatedtantalumtinoxidethinfilmpreparedusingtantalumtinacetylacetonateasprecursor AT bolutifeolofinjana spincoatedtantalumtinoxidethinfilmpreparedusingtantalumtinacetylacetonateasprecursor AT eusebisikechukwuobiajunwa spincoatedtantalumtinoxidethinfilmpreparedusingtantalumtinacetylacetonateasprecursor AT ezekieloladelebolarinwaajayi spincoatedtantalumtinoxidethinfilmpreparedusingtantalumtinacetylacetonateasprecursor |