Pursuing the Diffraction Limit with Nano-LED Scanning Transmission Optical Microscopy

Pursuing the Diffraction Limit with Nano-LED Scanning Transmission Optical Microscopy

Recent research into miniaturized illumination sources has prompted the development of alternative microscopy techniques. Although they are still being explored, emerging nano-light-emitting-diode (nano-LED) technologies show promise in approaching the optical resolution limit in a more feasible man...

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Bibliographic Details
Main Authors: Sergio Moreno, Joan Canals, Victor Moro, Nil Franch, Anna Vilà, Albert Romano-Rodriguez, Joan Daniel Prades, Daria D. Bezshlyakh, Andreas Waag, Katarzyna Kluczyk-Korch, Matthias Auf der Maur, Aldo Di Carlo, Sigurd Krieger, Silvana Geleff, Angel Diéguez
Format: Article
Language:English
Published: MDPI AG 2021-05-01
Series:Sensors
Subjects:
CMOS sensor
nano-LED
optical downscaling
nanopositioners
miniaturization
Online Access:https://www.mdpi.com/1424-8220/21/10/3305

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