Periodic Multilayer for X-ray Spectroscopy in the Li K Range
X-ray spectroscopy of lithium is very difficult, even impossible, with wavelength dispersive spectrometers commonly deployed on scanning electron microscopes or electron microprobe analyzers. This is due to the absence of crystals and lack of efficient periodic multilayer for this spectral range, ar...
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MDPI AG
2021-07-01
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| Online Access: | https://www.mdpi.com/2076-3417/11/14/6385 |
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| author | Vladimir Polkonikov Nikolai Chkhalo Roman Pleshkov Angelo Giglia Nicolas Rividi Emmanuelle Brackx Karine Le Guen Iyas Ismail Philippe Jonnard |
| author_facet | Vladimir Polkonikov Nikolai Chkhalo Roman Pleshkov Angelo Giglia Nicolas Rividi Emmanuelle Brackx Karine Le Guen Iyas Ismail Philippe Jonnard |
| author_sort | Vladimir Polkonikov |
| collection | DOAJ |
| description | X-ray spectroscopy of lithium is very difficult, even impossible, with wavelength dispersive spectrometers commonly deployed on scanning electron microscopes or electron microprobe analyzers. This is due to the absence of crystals and lack of efficient periodic multilayer for this spectral range, around 50 eV. To address this issue, we propose using a Be/Si/Al multilayer having a period of about 29 nm. The multilayer was deposited by magnetron sputtering and its reflectivity measured as a function of the glancing angle in the spectral range of the Li K emission and as a function of the incident energy up to ~200 eV. This characterization demonstrates that the designed multilayer is suitable to efficiently perform spectroscopy in the range of the Li K emission in terms of reflectance (0.32 at 51.5 eV), bandwidth (around 3.5 eV) and rejection of high order diffracted radiation. |
| first_indexed | 2024-03-10T09:46:39Z |
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| issn | 2076-3417 |
| language | English |
| last_indexed | 2024-03-10T09:46:39Z |
| publishDate | 2021-07-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Applied Sciences |
| spelling | doaj.art-1bb0a55bb0564642b02af10b464812702023-11-22T03:08:52ZengMDPI AGApplied Sciences2076-34172021-07-011114638510.3390/app11146385Periodic Multilayer for X-ray Spectroscopy in the Li K RangeVladimir Polkonikov0Nikolai Chkhalo1Roman Pleshkov2Angelo Giglia3Nicolas Rividi4Emmanuelle Brackx5Karine Le Guen6Iyas Ismail7Philippe Jonnard8Institute of Physics of Microstructure, Russian Academy of Sciences, 603087 Nizhny Novgorod, RussiaInstitute of Physics of Microstructure, Russian Academy of Sciences, 603087 Nizhny Novgorod, RussiaInstitute of Physics of Microstructure, Russian Academy of Sciences, 603087 Nizhny Novgorod, RussiaInstituto Officina Dei Materiali—Consiglio Nazionale Delle Ricerche, 34149 Trieste, ItalyService Camparis, UMR7154—CNRS, Institut de Physique du Globe, CEDEX 05, 75252 Paris, FranceCommissariat à L’énergie Atomique et aux Énergies Alternatives, Direction des Énergies, Institut Pour les Sciences et Technologies Pour une Economie Circulaire des Energies bas Carbone, Département de Recherche sur les Procédés Pour la Mine et le Recyclage du Combustible, Univ Montpellier, Marcoule, 34095 Montpellier, FranceLaboratoire de Chimie Physique—Matière et Rayonnement, Faculté des Sciences et Ingénierie, Sorbonne Université, Unité Mixte de Recherche du Centre National de la Recherche Scientifique, 4 Place Jussieu, CEDEX 05, 75252 Paris, FranceLaboratoire de Chimie Physique—Matière et Rayonnement, Faculté des Sciences et Ingénierie, Sorbonne Université, Unité Mixte de Recherche du Centre National de la Recherche Scientifique, 4 Place Jussieu, CEDEX 05, 75252 Paris, FranceLaboratoire de Chimie Physique—Matière et Rayonnement, Faculté des Sciences et Ingénierie, Sorbonne Université, Unité Mixte de Recherche du Centre National de la Recherche Scientifique, 4 Place Jussieu, CEDEX 05, 75252 Paris, FranceX-ray spectroscopy of lithium is very difficult, even impossible, with wavelength dispersive spectrometers commonly deployed on scanning electron microscopes or electron microprobe analyzers. This is due to the absence of crystals and lack of efficient periodic multilayer for this spectral range, around 50 eV. To address this issue, we propose using a Be/Si/Al multilayer having a period of about 29 nm. The multilayer was deposited by magnetron sputtering and its reflectivity measured as a function of the glancing angle in the spectral range of the Li K emission and as a function of the incident energy up to ~200 eV. This characterization demonstrates that the designed multilayer is suitable to efficiently perform spectroscopy in the range of the Li K emission in terms of reflectance (0.32 at 51.5 eV), bandwidth (around 3.5 eV) and rejection of high order diffracted radiation.https://www.mdpi.com/2076-3417/11/14/6385nanoscale multilayerX-ray emission spectroscopylithiummultilayer mirrorberyllium |
| spellingShingle | Vladimir Polkonikov Nikolai Chkhalo Roman Pleshkov Angelo Giglia Nicolas Rividi Emmanuelle Brackx Karine Le Guen Iyas Ismail Philippe Jonnard Periodic Multilayer for X-ray Spectroscopy in the Li K Range Applied Sciences nanoscale multilayer X-ray emission spectroscopy lithium multilayer mirror beryllium |
| title | Periodic Multilayer for X-ray Spectroscopy in the Li K Range |
| title_full | Periodic Multilayer for X-ray Spectroscopy in the Li K Range |
| title_fullStr | Periodic Multilayer for X-ray Spectroscopy in the Li K Range |
| title_full_unstemmed | Periodic Multilayer for X-ray Spectroscopy in the Li K Range |
| title_short | Periodic Multilayer for X-ray Spectroscopy in the Li K Range |
| title_sort | periodic multilayer for x ray spectroscopy in the li k range |
| topic | nanoscale multilayer X-ray emission spectroscopy lithium multilayer mirror beryllium |
| url | https://www.mdpi.com/2076-3417/11/14/6385 |
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