Overview of software tools for modeling single event upsets in microelectronic devices
The paper presents the results of the analysis of existing simulation tools for evaluation of single event upset susceptibility of microelectronic devices with deep sub-micron feature sizes. This simulation tools are meant to replace obsolete approach to single event rate estimation based on integra...
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| Format: | Article |
| Language: | English |
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Joint Stock Company "Experimental Scientific and Production Association SPELS
2016-10-01
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| Series: | Безопасность информационных технологий |
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| Online Access: | https://bit.mephi.ru/index.php/bit/article/view/21 |
| Summary: | The paper presents the results of the analysis of existing simulation tools for evaluation of single event upset susceptibility of microelectronic devices with deep sub-micron feature sizes. This simulation tools are meant to replace obsolete approach to single event rate estimation based on integral rectangular parallelepiped model. Three main approaches implemented in simulation tools are considered: combined use of particle transport codes and rectangular parallelepiped model, combined use of particle transport codes and analytical models of charge collection and circuit simulators, and combined use of particle transport codes and TCAD simulators. |
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| ISSN: | 2074-7128 2074-7136 |