Application of wavelet-analysis for image filtration in electronic and probe microscopy

Application of wavelet-analysis for image filtration in electronic and probe microscopy

The review presents the results of application of the programs of discrete and stationary wavelet-analysis for filtration of object image from noise and for the increase of its resolution capability in electronic and probe microscopy.

Bibliographic Details
Main Authors: N. P. Konnov, Yu. P. Volkov, M. N. Kireev, O. S. Kuznetsov
Format: Article
Language:Russian
Published: Federal Government Health Institution, Russian Research Anti-Plague Institute “Microbe” 2008-06-01
Series:Проблемы особо опасных инфекций
Subjects:
wavelet-analysis
electronic and probe microscopy
Online Access:https://journal.microbe.ru/jour/article/view/1042

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