Deep Metric Learning Using Negative Sampling Probability Annealing

Multiple studies have concluded that the selection of input samples is key for deep metric learning. For triplet networks, the selection of the anchor, positive, and negative pairs is referred to as triplet mining. The selection of the negatives is considered the be the most complicated task, due to...

Full description

Bibliographic Details
Main Author: Gábor Kertész
Format: Article
Language:English
Published: MDPI AG 2022-10-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/22/19/7579
_version_ 1797476866956722176
author Gábor Kertész
author_facet Gábor Kertész
author_sort Gábor Kertész
collection DOAJ
description Multiple studies have concluded that the selection of input samples is key for deep metric learning. For triplet networks, the selection of the anchor, positive, and negative pairs is referred to as triplet mining. The selection of the negatives is considered the be the most complicated task, due to a large number of possibilities. The goal is to select a negative that results in a positive triplet loss; however, there are multiple approaches for this—semi-hard negative mining or hardest mining are well-known in addition to random selection. Since its introduction, semi-hard mining was proven to outperform other negative mining techniques; however, in recent years, the selection of the so-called hardest negative has shown promising results in different experiments. This paper introduces a novel negative sampling solution based on dynamic policy switching, referred to as negative sampling probability annealing, which aims to exploit the positives of all approaches. Results are validated on an experimental synthetic dataset using cluster-analysis methods; finally, the discriminative abilities of trained models are measured on real-life data.
first_indexed 2024-03-09T21:09:51Z
format Article
id doaj.art-1cd94dae4e18470da3aee6274736591e
institution Directory Open Access Journal
issn 1424-8220
language English
last_indexed 2024-03-09T21:09:51Z
publishDate 2022-10-01
publisher MDPI AG
record_format Article
series Sensors
spelling doaj.art-1cd94dae4e18470da3aee6274736591e2023-11-23T21:51:27ZengMDPI AGSensors1424-82202022-10-012219757910.3390/s22197579Deep Metric Learning Using Negative Sampling Probability AnnealingGábor Kertész0John von Neumann Faculty of Informatics, Obuda University, 1034 Budapest, HungaryMultiple studies have concluded that the selection of input samples is key for deep metric learning. For triplet networks, the selection of the anchor, positive, and negative pairs is referred to as triplet mining. The selection of the negatives is considered the be the most complicated task, due to a large number of possibilities. The goal is to select a negative that results in a positive triplet loss; however, there are multiple approaches for this—semi-hard negative mining or hardest mining are well-known in addition to random selection. Since its introduction, semi-hard mining was proven to outperform other negative mining techniques; however, in recent years, the selection of the so-called hardest negative has shown promising results in different experiments. This paper introduces a novel negative sampling solution based on dynamic policy switching, referred to as negative sampling probability annealing, which aims to exploit the positives of all approaches. Results are validated on an experimental synthetic dataset using cluster-analysis methods; finally, the discriminative abilities of trained models are measured on real-life data.https://www.mdpi.com/1424-8220/22/19/7579negative sampling probability annealingtriplet miningdeep metric learningtriplet network
spellingShingle Gábor Kertész
Deep Metric Learning Using Negative Sampling Probability Annealing
Sensors
negative sampling probability annealing
triplet mining
deep metric learning
triplet network
title Deep Metric Learning Using Negative Sampling Probability Annealing
title_full Deep Metric Learning Using Negative Sampling Probability Annealing
title_fullStr Deep Metric Learning Using Negative Sampling Probability Annealing
title_full_unstemmed Deep Metric Learning Using Negative Sampling Probability Annealing
title_short Deep Metric Learning Using Negative Sampling Probability Annealing
title_sort deep metric learning using negative sampling probability annealing
topic negative sampling probability annealing
triplet mining
deep metric learning
triplet network
url https://www.mdpi.com/1424-8220/22/19/7579
work_keys_str_mv AT gaborkertesz deepmetriclearningusingnegativesamplingprobabilityannealing