Thermal monitoring as a method for estimation of technical state of digital devices
Requirements to the reliability level of modern element base are so high that traditional methods of assessing the technical condition of electronics become ineffective, the modern theory of reliability has almost no practical applications [1], and reliability index does not reflect the true state o...
Main Author: | Lavrich Yu. N. |
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Format: | Article |
Language: | English |
Published: |
Politehperiodika
2015-08-01
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Series: | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature |
Subjects: | |
Online Access: | http://www.tkea.com.ua/tkea/2015/4_2015/pdf/07.pdf |
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