Analytic investigations on the susceptibility of nonlinear <br/> analog circuits to substrate noise
This work deals with the conducted susceptibility of nonlinear analog circuits with respect to substrate noise. The substrate coupling mechanism is modeled by a passive three-terminal network that is obtained by means of the finite element method with a subsequently performed model order reduction....
| Main Authors: | , , , |
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| Format: | Article |
| Language: | deu |
| Published: |
Copernicus Publications
2013-07-01
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| Series: | Advances in Radio Science |
| Online Access: | http://www.adv-radio-sci.net/11/171/2013/ars-11-171-2013.pdf |
| Summary: | This work deals with the conducted susceptibility of nonlinear analog
circuits with respect to substrate noise. The substrate coupling mechanism is
modeled by a passive three-terminal network that is obtained by means of the
finite element method with a subsequently performed model order reduction.
Applying this substrate model to the bulk terminal of MOS transistors in
integrated analog circuits, it is possible to examine the influence of
substrate noise on the circuit's functionality. By means of a block-oriented
approach, analytic expressions for the output behavior of the circuits are
found. The utilized multi-input Wiener model separates the linear dynamic
from the nonlinear static circuit properties. Due to this separation the
frequency response of both signals, i.e.,input signal and substrate noise,
respectively, can be identified, and hence, the frequency range in which the
circuit is most susceptible to substrate noise. Since the nonlinear static
behavior of each MOS transistor depends on two signals, truncated
multivariate Taylor series expansions of the nonlinear elements are performed
on the basis of the EKV model description (Enz et al., 1995). The proposed
modeling is illustrated by a simple example. |
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| ISSN: | 1684-9965 1684-9973 |