Analytic investigations on the susceptibility of nonlinear <br/> analog circuits to substrate noise
This work deals with the conducted susceptibility of nonlinear analog circuits with respect to substrate noise. The substrate coupling mechanism is modeled by a passive three-terminal network that is obtained by means of the finite element method with a subsequently performed model order reduction....
| Main Authors: | , , , |
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| Format: | Article |
| Language: | deu |
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Copernicus Publications
2013-07-01
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| Series: | Advances in Radio Science |
| Online Access: | http://www.adv-radio-sci.net/11/171/2013/ars-11-171-2013.pdf |
| _version_ | 1819154698417995776 |
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| author | C. Widemann S. Stegemann W. John W. Mathis |
| author_facet | C. Widemann S. Stegemann W. John W. Mathis |
| author_sort | C. Widemann |
| collection | DOAJ |
| description | This work deals with the conducted susceptibility of nonlinear analog
circuits with respect to substrate noise. The substrate coupling mechanism is
modeled by a passive three-terminal network that is obtained by means of the
finite element method with a subsequently performed model order reduction.
Applying this substrate model to the bulk terminal of MOS transistors in
integrated analog circuits, it is possible to examine the influence of
substrate noise on the circuit's functionality. By means of a block-oriented
approach, analytic expressions for the output behavior of the circuits are
found. The utilized multi-input Wiener model separates the linear dynamic
from the nonlinear static circuit properties. Due to this separation the
frequency response of both signals, i.e.,input signal and substrate noise,
respectively, can be identified, and hence, the frequency range in which the
circuit is most susceptible to substrate noise. Since the nonlinear static
behavior of each MOS transistor depends on two signals, truncated
multivariate Taylor series expansions of the nonlinear elements are performed
on the basis of the EKV model description (Enz et al., 1995). The proposed
modeling is illustrated by a simple example. |
| first_indexed | 2024-12-22T15:25:13Z |
| format | Article |
| id | doaj.art-1d6bfed5f54c41f6a07b8ab7d760449f |
| institution | Directory Open Access Journal |
| issn | 1684-9965 1684-9973 |
| language | deu |
| last_indexed | 2024-12-22T15:25:13Z |
| publishDate | 2013-07-01 |
| publisher | Copernicus Publications |
| record_format | Article |
| series | Advances in Radio Science |
| spelling | doaj.art-1d6bfed5f54c41f6a07b8ab7d760449f2022-12-21T18:21:31ZdeuCopernicus PublicationsAdvances in Radio Science1684-99651684-99732013-07-011117117510.5194/ars-11-171-2013Analytic investigations on the susceptibility of nonlinear <br/> analog circuits to substrate noiseC. Widemann0S. Stegemann1W. John2W. Mathis3Institut für theoretische Elektrotechnik, Leibniz Universität Hannover, Appelstraße 9A, 30167 Hannover, GermanyInstitut für theoretische Elektrotechnik, Leibniz Universität Hannover, Appelstraße 9A, 30167 Hannover, GermanyInstitut für theoretische Elektrotechnik, Leibniz Universität Hannover, Appelstraße 9A, 30167 Hannover, GermanyInstitut für theoretische Elektrotechnik, Leibniz Universität Hannover, Appelstraße 9A, 30167 Hannover, GermanyThis work deals with the conducted susceptibility of nonlinear analog circuits with respect to substrate noise. The substrate coupling mechanism is modeled by a passive three-terminal network that is obtained by means of the finite element method with a subsequently performed model order reduction. Applying this substrate model to the bulk terminal of MOS transistors in integrated analog circuits, it is possible to examine the influence of substrate noise on the circuit's functionality. By means of a block-oriented approach, analytic expressions for the output behavior of the circuits are found. The utilized multi-input Wiener model separates the linear dynamic from the nonlinear static circuit properties. Due to this separation the frequency response of both signals, i.e.,input signal and substrate noise, respectively, can be identified, and hence, the frequency range in which the circuit is most susceptible to substrate noise. Since the nonlinear static behavior of each MOS transistor depends on two signals, truncated multivariate Taylor series expansions of the nonlinear elements are performed on the basis of the EKV model description (Enz et al., 1995). The proposed modeling is illustrated by a simple example.http://www.adv-radio-sci.net/11/171/2013/ars-11-171-2013.pdf |
| spellingShingle | C. Widemann S. Stegemann W. John W. Mathis Analytic investigations on the susceptibility of nonlinear <br/> analog circuits to substrate noise Advances in Radio Science |
| title | Analytic investigations on the susceptibility of nonlinear <br/> analog circuits to substrate noise |
| title_full | Analytic investigations on the susceptibility of nonlinear <br/> analog circuits to substrate noise |
| title_fullStr | Analytic investigations on the susceptibility of nonlinear <br/> analog circuits to substrate noise |
| title_full_unstemmed | Analytic investigations on the susceptibility of nonlinear <br/> analog circuits to substrate noise |
| title_short | Analytic investigations on the susceptibility of nonlinear <br/> analog circuits to substrate noise |
| title_sort | analytic investigations on the susceptibility of nonlinear br analog circuits to substrate noise |
| url | http://www.adv-radio-sci.net/11/171/2013/ars-11-171-2013.pdf |
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