Failure mechanisms in flexible electronics

ABSTRACTThe rapid evolution of flexible electronic devices promises to revolutionize numerous fields by expanding the applications of smart devices. Nevertheless, despite this vast potential, the reliability of these innovative devices currently falls short, especially in light of demanding operatio...

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Bibliographic Details
Main Authors: Zhehui Zhao, Haoran Fu, Ruitao Tang, Bocheng Zhang, Yunmin Chen, Jianqun Jiang
Format: Article
Language:English
Published: Taylor & Francis Group 2023-10-01
Series:International Journal of Smart and Nano Materials
Subjects:
Online Access:https://www.tandfonline.com/doi/10.1080/19475411.2023.2261775

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