Classification of a 3D Film Pattern Image Using the Optimal Height of the Histogram for Quality Inspection
A 3D film pattern image was recently developed for marketing purposes, and an inspection method is needed to evaluate the quality of the pattern for mass production. However, due to its recent development, there are limited methods to inspect the 3D film pattern. The good pattern in the 3D film has...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2023-08-01
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| Series: | Journal of Imaging |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2313-433X/9/8/156 |
| _version_ | 1797584229604786176 |
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| author | Jaeeun Lee Hongseok Choi Kyeongmin Yum Jungwon Park Jongnam Kim |
| author_facet | Jaeeun Lee Hongseok Choi Kyeongmin Yum Jungwon Park Jongnam Kim |
| author_sort | Jaeeun Lee |
| collection | DOAJ |
| description | A 3D film pattern image was recently developed for marketing purposes, and an inspection method is needed to evaluate the quality of the pattern for mass production. However, due to its recent development, there are limited methods to inspect the 3D film pattern. The good pattern in the 3D film has a clear outline and high contrast, while the bad pattern has a blurry outline and low contrast. Due to these characteristics, it is challenging to examine the quality of the 3D film pattern. In this paper, we propose a simple algorithm that classifies the 3D film pattern as either good or bad by using the height of the histograms. Despite its simplicity, the proposed method can accurately and quickly inspect the 3D film pattern. In the experimental results, the proposed method achieved 99.09% classification accuracy with a computation time of 6.64 s, demonstrating better performance than existing algorithms. |
| first_indexed | 2024-03-10T23:50:09Z |
| format | Article |
| id | doaj.art-1e9925ae8bb04f1998683ef3cdba072e |
| institution | Directory Open Access Journal |
| issn | 2313-433X |
| language | English |
| last_indexed | 2024-03-10T23:50:09Z |
| publishDate | 2023-08-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Journal of Imaging |
| spelling | doaj.art-1e9925ae8bb04f1998683ef3cdba072e2023-11-19T01:43:35ZengMDPI AGJournal of Imaging2313-433X2023-08-019815610.3390/jimaging9080156Classification of a 3D Film Pattern Image Using the Optimal Height of the Histogram for Quality InspectionJaeeun Lee0Hongseok Choi1Kyeongmin Yum2Jungwon Park3Jongnam Kim4Department of Artificial Intelligence Convergence, Pukyong National University, 45, Yongso-ro, Nam-gu, Busan 48513, Republic of KoreaDepartment of Artificial Intelligence Convergence, Pukyong National University, 45, Yongso-ro, Nam-gu, Busan 48513, Republic of KoreaCollege of Business, Seoul National University, 1, Gwanak-ro, Gwanak-gu, Seoul 08826, Republic of KoreaElectronic and Computer Engineering Technology, University of Hawaii Maui College, 310 W Kaahumanu Ave, Kahului, HI 96732, USADepartment of Artificial Intelligence Convergence, Pukyong National University, 45, Yongso-ro, Nam-gu, Busan 48513, Republic of KoreaA 3D film pattern image was recently developed for marketing purposes, and an inspection method is needed to evaluate the quality of the pattern for mass production. However, due to its recent development, there are limited methods to inspect the 3D film pattern. The good pattern in the 3D film has a clear outline and high contrast, while the bad pattern has a blurry outline and low contrast. Due to these characteristics, it is challenging to examine the quality of the 3D film pattern. In this paper, we propose a simple algorithm that classifies the 3D film pattern as either good or bad by using the height of the histograms. Despite its simplicity, the proposed method can accurately and quickly inspect the 3D film pattern. In the experimental results, the proposed method achieved 99.09% classification accuracy with a computation time of 6.64 s, demonstrating better performance than existing algorithms.https://www.mdpi.com/2313-433X/9/8/1563D film pattern imageclassificationimage processingquality inspectionheight of the histogram |
| spellingShingle | Jaeeun Lee Hongseok Choi Kyeongmin Yum Jungwon Park Jongnam Kim Classification of a 3D Film Pattern Image Using the Optimal Height of the Histogram for Quality Inspection Journal of Imaging 3D film pattern image classification image processing quality inspection height of the histogram |
| title | Classification of a 3D Film Pattern Image Using the Optimal Height of the Histogram for Quality Inspection |
| title_full | Classification of a 3D Film Pattern Image Using the Optimal Height of the Histogram for Quality Inspection |
| title_fullStr | Classification of a 3D Film Pattern Image Using the Optimal Height of the Histogram for Quality Inspection |
| title_full_unstemmed | Classification of a 3D Film Pattern Image Using the Optimal Height of the Histogram for Quality Inspection |
| title_short | Classification of a 3D Film Pattern Image Using the Optimal Height of the Histogram for Quality Inspection |
| title_sort | classification of a 3d film pattern image using the optimal height of the histogram for quality inspection |
| topic | 3D film pattern image classification image processing quality inspection height of the histogram |
| url | https://www.mdpi.com/2313-433X/9/8/156 |
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