A Two-Step A/D Conversion and Column Self-Calibration Technique for Low Noise CMOS Image Sensors

A Two-Step A/D Conversion and Column Self-Calibration Technique for Low Noise CMOS Image Sensors

In this paper, a 120 frames per second (fps) low noise CMOS Image Sensor (CIS) based on a Two-Step Single Slope ADC (TS SS ADC) and column self-calibration technique is proposed. The TS SS ADC is suitable for high speed video systems because its conversion speed is much faster (by more than 10 times...

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Bibliographic Details
Main Authors: Jaeyoung Bae, Daeyun Kim, Seokheon Ham, Youngcheol Chae, Minkyu Song
Format: Article
Language:English
Published: MDPI AG 2014-07-01
Series:Sensors
Subjects:
CMOS Image Sensor (CIS)
Two-Step Single-Slope ADC
column self-calibration
low noise
Online Access:http://www.mdpi.com/1424-8220/14/7/11825

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