Compositional Analysis of SiOC(H) Powders: A Comparison of X-ray Photoelectron Spectroscopy (XPS) and Combustion Analysis
Accurate chemical analysis of small samples of fine powders in the Si–O–C–H system is challenging. We present a comparison of analysis by X-ray photoelectron spectroscopy (XPS) and combustion analysis, validating XPS as an accurate and simple methodology for Si, C, and O analysis to give bulk and no...
Main Authors: | Gerson J. Leonel, Xin Guo, Gurpreet Singh, Alexandra Navrotsky |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2023-01-01
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Series: | Ceramics |
Subjects: | |
Online Access: | https://www.mdpi.com/2571-6131/6/1/6 |
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