Compositional Analysis of SiOC(H) Powders: A Comparison of X-ray Photoelectron Spectroscopy (XPS) and Combustion Analysis

Accurate chemical analysis of small samples of fine powders in the Si–O–C–H system is challenging. We present a comparison of analysis by X-ray photoelectron spectroscopy (XPS) and combustion analysis, validating XPS as an accurate and simple methodology for Si, C, and O analysis to give bulk and no...

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Bibliographic Details
Main Authors: Gerson J. Leonel, Xin Guo, Gurpreet Singh, Alexandra Navrotsky
Format: Article
Language:English
Published: MDPI AG 2023-01-01
Series:Ceramics
Subjects:
Online Access:https://www.mdpi.com/2571-6131/6/1/6

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