A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning
Electronic manufacturing and design companies maintain test sites for a range of products. These products are designed according to the end-user requirements. The end user requirement, then, determines which of the proof of design and manufacturing tests are needed. Test sites are designed to carry...
Main Authors: | Atif Siddiqui, Pablo Otero, Muhammad Zubair |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2023-01-01
|
Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/23/2/705 |
Similar Items
-
Using LabVIEW to enhance industrial automation and control /
by: 364676 Sallehuddin Ibrahim, et al. -
Development of virtual instrument using labview [electronic resource] /
by: 450657 Kok, Ping Li
Published: (2009) -
Development of virtual instrument using LabVIEW /
by: 450657 Kok, Ping Li, et al.
Published: (2009) -
A Universal Machine-Learning-Based Automated Testing System for Consumer Electronic Products
by: Atif Siddiqui, et al.
Published: (2021-01-01) -
Automatic batch weighing and discharge system using NI LabVIEW and auger mechanism
by: V Venkataramanan, et al.
Published: (2023-12-01)