A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning

Electronic manufacturing and design companies maintain test sites for a range of products. These products are designed according to the end-user requirements. The end user requirement, then, determines which of the proof of design and manufacturing tests are needed. Test sites are designed to carry...

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Bibliographic Details
Main Authors: Atif Siddiqui, Pablo Otero, Muhammad Zubair
Format: Article
Language:English
Published: MDPI AG 2023-01-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/23/2/705

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