Temperature Compensation Method for Raster Projectors Used in 3D Structured Light Scanners
Raster projectors are commonly used in many various measurement applications where active lighting is required, such as in three-dimensional structured light scanners. The effect of temperature on the raster projector, in some conditions, can lead to significant deterioration of the measurements per...
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| Format: | Article |
| Language: | English |
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MDPI AG
2020-10-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/20/20/5778 |