Study of Characteristics of Porous Silicon by Electrochemical Etching

Study of Characteristics of Porous Silicon by Electrochemical Etching

In this work, the nanocrystalline porous silicon layer is prepared by electrochemical etching of p-type silicon wafer. The morphological films characterized have been studied of the by atomic force microscopy, XRD and FTIR spectroscopy.The atomic force microscopy investigation shows the average diam...

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Bibliographic Details
Main Author:	Hasan Hadi Hussein
Format:	Article
Language:	English
Published:	Unviversity of Technology- Iraq 2013-01-01
Series:	Engineering and Technology Journal
Subjects:	porous silicon electrochemical etching morphological ftir
Online Access:	https://etj.uotechnology.edu.iq/article_83949_6926c2edef69ef8948a7e94740e3be83.pdf

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