In situ capabilities of Small Angle X-ray Scattering

Small Angle X-ray Scattering (SAXS) is an ideal characterization tool to explore nanoscale systems. In order to investigate nanostructural changes of materials under realistic sample environments, it is essential to equip SAXS with diverse in situ capabilities based on the corresponding requirements...

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Bibliographic Details
Main Authors: Feng Jinghua, Kriechbaum Manfred, Liu Li (Emily)
Format: Article
Language:English
Published: De Gruyter 2019-12-01
Series:Nanotechnology Reviews
Subjects:
Online Access:https://doi.org/10.1515/ntrev-2019-0032
Description
Summary:Small Angle X-ray Scattering (SAXS) is an ideal characterization tool to explore nanoscale systems. In order to investigate nanostructural changes of materials under realistic sample environments, it is essential to equip SAXS with diverse in situ capabilities based on the corresponding requirements. In this paper, we highlight the representative experimental setups and corresponding applications of five widely used in situ capabilities: temperature, pressure, stretching, flow-through, and electric field. Additionally, we also briefly introduce other four in situ techniques including humidity, high-throughput, rheology, and magnetic field.
ISSN:2191-9097