Effect of diode laser application on root surface carbon, calcium and phosphorus levels: A SEM-EDX study

Background:Preservation of the organic ingredients on the root surfaces during the periodontal therapy has been emphasized in the literature. SEM-EDX analysis is an accepted approach to evaluate organic and inorganic components on investigated samples in terms of carbon, calcium and phosphor levels....

Full description

Bibliographic Details
Main Author: Emre Yaprak
Format: Article
Language:English
Published: Selçuk University 2019-08-01
Series:Selcuk Dental Journal
Subjects:
Online Access:https://dergipark.org.tr/tr/download/article-file/892011
Description
Summary:Background:Preservation of the organic ingredients on the root surfaces during the periodontal therapy has been emphasized in the literature. SEM-EDX analysis is an accepted approach to evaluate organic and inorganic components on investigated samples in terms of carbon, calcium and phosphor levels. The aim of this study was to evaluate the effects of diode laser application with periodontal pocket decontamination energy setting to the organic content of intact root surfaces via SEM-EDX analysis.Methods: Each proximal root surfaces of the root surfaces of 10 teeth which were extracted due to orthodontic reasons were divided as test (n=20) and control (n=20) sites. Diode laser (810 nm) applications were done to the test sites of root surfaces. All specimens were analyzed using SEM-EDX with respect to carbon, calcium and phosphor levels.Results:Diode laser applied root surfaces exhibit significantly lower carbon levels comparing with control sites. Additionally, increased calcium and phosphor levels were detected in the test sites.Conclusions:Within the limitations of this study, it can be concluded that, diode laser applications may alter organic content of intact root surface. Further studies are required to elucidate potential effects of diode laser application to specific protein components on the root surfaces.Keywords: Diode laser, root surface, SEM-EDX, element levels
ISSN:2148-7529