Determination of InN/Diamond Heterojunction Band Offset by X-ray Photoelectron Spectroscopy

Determination of InN/Diamond Heterojunction Band Offset by X-ray Photoelectron Spectroscopy

<p>Abstract</p> <p>Diamond is not only a free standing highly transparent window but also a promising carrier confinement layer for InN based devices, yet little is known of the band offsets in InN/diamond system. X-ray photoelectron spectroscopy was used to measure the energy disc...

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Bibliographic Details
Main Authors: Li DB, Shi K, Song HP, Guo Y, Wang J, Xu XQ, Liu JM, Yang AL, Wei HY, Zhang B, Yang SY, Liu XL, Zhu QS, Wang ZG
Format: Article
Language:English
Published: SpringerOpen 2011-01-01
Series:Nanoscale Research Letters
Subjects:
Valence band offset
InN/diamond heterojunction
X-ray photoelectron spectroscopy
Conduction band offset
Online Access:http://www.nanoscalereslett.com/content/6/1/50

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