A Variable Sampling Interval Synthetic Xbar Chart for the Process Mean.

The usual practice of using a control chart to monitor a process is to take samples from the process with fixed sampling interval (FSI). In this paper, a synthetic X control chart with the variable sampling interval (VSI) feature is proposed for monitoring changes in the process mean. The VSI synthe...

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Main Authors: Lei Yong Lee, Michael Boon Chong Khoo, Sin Yin Teh, Ming Ha Lee
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2015-01-01
Series:PLoS ONE
Online Access:http://europepmc.org/articles/PMC4423939?pdf=render
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author Lei Yong Lee
Michael Boon Chong Khoo
Sin Yin Teh
Ming Ha Lee
author_facet Lei Yong Lee
Michael Boon Chong Khoo
Sin Yin Teh
Ming Ha Lee
author_sort Lei Yong Lee
collection DOAJ
description The usual practice of using a control chart to monitor a process is to take samples from the process with fixed sampling interval (FSI). In this paper, a synthetic X control chart with the variable sampling interval (VSI) feature is proposed for monitoring changes in the process mean. The VSI synthetic X chart integrates the VSI X chart and the VSI conforming run length (CRL) chart. The proposed VSI synthetic X chart is evaluated using the average time to signal (ATS) criterion. The optimal charting parameters of the proposed chart are obtained by minimizing the out-of-control ATS for a desired shift. Comparisons between the VSI synthetic X chart and the existing X, synthetic X, VSI X and EWMA X charts, in terms of ATS, are made. The ATS results show that the VSI synthetic X chart outperforms the other X type charts for detecting moderate and large shifts. An illustrative example is also presented to explain the application of the VSI synthetic X chart.
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spelling doaj.art-22798af23d57452fa1c88c20e3df18882022-12-21T23:57:28ZengPublic Library of Science (PLoS)PLoS ONE1932-62032015-01-01105e012633110.1371/journal.pone.0126331A Variable Sampling Interval Synthetic Xbar Chart for the Process Mean.Lei Yong LeeMichael Boon Chong KhooSin Yin TehMing Ha LeeThe usual practice of using a control chart to monitor a process is to take samples from the process with fixed sampling interval (FSI). In this paper, a synthetic X control chart with the variable sampling interval (VSI) feature is proposed for monitoring changes in the process mean. The VSI synthetic X chart integrates the VSI X chart and the VSI conforming run length (CRL) chart. The proposed VSI synthetic X chart is evaluated using the average time to signal (ATS) criterion. The optimal charting parameters of the proposed chart are obtained by minimizing the out-of-control ATS for a desired shift. Comparisons between the VSI synthetic X chart and the existing X, synthetic X, VSI X and EWMA X charts, in terms of ATS, are made. The ATS results show that the VSI synthetic X chart outperforms the other X type charts for detecting moderate and large shifts. An illustrative example is also presented to explain the application of the VSI synthetic X chart.http://europepmc.org/articles/PMC4423939?pdf=render
spellingShingle Lei Yong Lee
Michael Boon Chong Khoo
Sin Yin Teh
Ming Ha Lee
A Variable Sampling Interval Synthetic Xbar Chart for the Process Mean.
PLoS ONE
title A Variable Sampling Interval Synthetic Xbar Chart for the Process Mean.
title_full A Variable Sampling Interval Synthetic Xbar Chart for the Process Mean.
title_fullStr A Variable Sampling Interval Synthetic Xbar Chart for the Process Mean.
title_full_unstemmed A Variable Sampling Interval Synthetic Xbar Chart for the Process Mean.
title_short A Variable Sampling Interval Synthetic Xbar Chart for the Process Mean.
title_sort variable sampling interval synthetic xbar chart for the process mean
url http://europepmc.org/articles/PMC4423939?pdf=render
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